2004, ISBN: 9780387231167
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Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice - gebonden uitgave, pocketboek
2004, ISBN: 9780387231167
Editor: Giannuzzi, Lucille A. Editor: North Carolina State University Center for the Biology of, Springer, Hardcover, Auflage: 2005, 374 Seiten, Publiziert: 2004-11-19T00:00:01Z, Produktg… Meer...
2004, ISBN: 9780387231167
Springer, Gebundene Ausgabe, Auflage: 2005, 374 Seiten, Publiziert: 2004-11-19T00:00:01Z, Produktgruppe: Buch, Hersteller-Nr.: 13743395, 3.44 kg, Verkaufsrang: 4915, Maschinenbau, Ingenie… Meer...
2004
ISBN: 9780387231167
Springer, Gebundene Ausgabe, Auflage: 2005, 374 Seiten, Publiziert: 2004-11-19T00:00:01Z, Produktgruppe: Buch, Hersteller-Nr.: 13743395, 3.44 kg, Verkaufsrang: 4915, Maschinenbau, Ingenie… Meer...
2004, ISBN: 9780387231167
Instrumentation, Theory, Techniques and Practice, Buch, Hardcover, 2005 ed. Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that dis… Meer...
2004, ISBN: 0387231161
[EAN: 9780387231167], Used, good, [PU: Springer], Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have so… Meer...
Bibliografische gegevens van het best passende boek
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Gedetalleerde informatie over het boek. - Introduction to Focused Ion Beams
EAN (ISBN-13): 9780387231167
ISBN (ISBN-10): 0387231161
Gebonden uitgave
pocket book
Verschijningsjaar: 2005
Uitgever: Springer-Verlag New York Inc.
358 Bladzijden
Gewicht: 0,744 kg
Taal: eng/Englisch
Boek bevindt zich in het datenbestand sinds 2007-04-05T16:34:25+02:00 (Amsterdam)
Detailpagina laatst gewijzigd op 2023-07-22T05:45:59+02:00 (Amsterdam)
ISBN/EAN: 0387231161
ISBN - alternatieve schrijfwijzen:
0-387-23116-1, 978-0-387-23116-7
alternatieve schrijfwijzen en verwante zoekwoorden:
Auteur van het boek: isaac asimov
Titel van het boek: instrumentation, introduction focused ion beams, focus 2008, theory beams, beam theory, focused seven
Gegevens van de uitgever
Auteur: Lucille A. Giannuzzi
Titel: Introduction to Focused Ion Beams - Instrumentation, Theory, Techniques and Practice
Uitgeverij: Springer; Springer US
357 Bladzijden
Verschijningsjaar: 2004-11-19
New York; NY; US
Taal: Engels
192,59 € (DE)
197,99 € (AT)
212,50 CHF (CH)
Available
XVII, 357 p. 34 illus., 28 illus. in color.
BB; Hardcover, Softcover / Physik, Astronomie/Atomphysik, Kernphysik; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); Verstehen; SIMS; instruments; material; microscopy; spectroscopy; Condensed Matter Physics; Surfaces, Interfaces and Thin Film; Optical Materials; Spectroscopy; Materialwissenschaft; Technische Anwendung von elektronischen, magnetischen, optischen Materialien; Spektroskopie, Spektrochemie, Massenspektrometrie; EA; BC
The focused ion beam (FIB) instrument has experienced an intensive period of maturation since its inception. Numerous new techniques and applications have been brought to fruition, and over the past few years, the FIB has gained acceptance as more than just an expensive sample preparation tool. It has taken its place among the suite of other instruments commonly available in analytical and forensic laboratories, universities, geological, medical and biological research institutions, and manufacturing plants. Although the utility of the FIB is not limited to the preparation of specimens for subsequent analysis by other analytical techniques, it has revolutionized the area of TEM specimen preparation. The FIB has also been used to prepare samples for numerous other analytical techniques, and offers a wide range of other capabilities. While the mainstream of FIB usage remains within the semiconductor industry, FIB usage has expanded to applications in metallurgy, ceramics, composites, polymers, geology, art, biology, pharmaceuticals, forensics, and other disciplines. Computer automated procedures have been configured for unattended use of FIB and dual platform instruments. New applications of FIB and dual platform instrumentation are constantly being developed for materials characterization and nanotechnology. The site specific nature of the FIB milling and deposition capabilities allows preparation and processing of materials in ways that are limited only by one's imagination. Introduction to Focused Ion Beams is geared towards techniques and applications. The first portion of this book introduces the basics of FIB instrumentation, milling, and deposition capabilities. The chapter dedicated to ion-solid interactions is presented so that the FIB user can understand which parameters will influence FIB milling behavior. The remainder of the book focuses on how to prepare and analyze samples using FIB and related tools, and presents specific applications and techniques of the uses of FIB milling, deposition, and dual platform techniques. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and Dual platform instruments.Only text that discusses and presents the theory directly related to applications and the only one that disscusses the vast applications and techniques used in FIBs and dual platform instruments Includes supplementary material: sn.pub/extras
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