2009, ISBN: 9780471731726
It is the first book of its kind to bring together the pertinent physics, equations, and procedures for CMOS technology reliability in one place. Divided into six relatively independent t… Meer...
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2009, ISBN: 0471731722
[EAN: 9780471731726], Neubuch, [PU: Wiley & Sons|Wiley-IEEE Press], TECHNOLOGY & INDUSTRIAL ARTS ENGINEERING ELECTRICAL TECHNIK ELEKTRONIK ELEKTROTECHNIK NACHRICHTENTECHNIK TECHNISCHE ZUV… Meer...
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2009, ISBN: 9780471731726
gebonden uitgave
[ED: Gebunden], [PU: John Wiley & Sons], ALVIN W. STRONG, PhD, is retired from IBM in Essex Junction, Vermont. He holds nineteen patents, has authored or coauthored a number of papers, an… Meer...
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2009, ISBN: 9780471731726
Hard cover, New Book Original US edition, Perfect Condition. Printed in English. Excellent Quality, Service and customer satisfaction guaranteed., Brand New, [PU: Wiley-IEEE Press]
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2009, ISBN: 9780471731726
Buch, Hardcover, [PU: Wiley-IEEE Press], Wiley-IEEE Press, 2009
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2009, ISBN: 9780471731726
It is the first book of its kind to bring together the pertinent physics, equations, and procedures for CMOS technology reliability in one place. Divided into six relatively independent t… Meer...
Strong, Alvin W.|Wu, Ernest Y.|Vollertsen, Rolf-Peter|Sune, Jordi|La Rosa, Giuseppe|Sullivan, Timothy D.|Rauch, Stewart E.:
Reliability Wearout Mechanisms in Advanced CMOS Technologies - gebonden uitgave, pocketboek2009, ISBN: 0471731722
[EAN: 9780471731726], Neubuch, [PU: Wiley & Sons|Wiley-IEEE Press], TECHNOLOGY & INDUSTRIAL ARTS ENGINEERING ELECTRICAL TECHNIK ELEKTRONIK ELEKTROTECHNIK NACHRICHTENTECHNIK TECHNISCHE ZUV… Meer...
2009
ISBN: 9780471731726
gebonden uitgave
[ED: Gebunden], [PU: John Wiley & Sons], ALVIN W. STRONG, PhD, is retired from IBM in Essex Junction, Vermont. He holds nineteen patents, has authored or coauthored a number of papers, an… Meer...
2009, ISBN: 9780471731726
Hard cover, New Book Original US edition, Perfect Condition. Printed in English. Excellent Quality, Service and customer satisfaction guaranteed., Brand New, [PU: Wiley-IEEE Press]
Bibliografische gegevens van het best passende boek
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Gedetalleerde informatie over het boek. - Reliability Wearout Mechanisms in Advanced CMOS Technologies
EAN (ISBN-13): 9780471731726
ISBN (ISBN-10): 0471731722
Gebonden uitgave
pocket book
Verschijningsjaar: 2009
Uitgever: Wiley-IEEE Press
624 Bladzijden
Gewicht: 0,980 kg
Taal: eng/Englisch
Boek bevindt zich in het datenbestand sinds 2007-07-05T07:08:40+02:00 (Amsterdam)
Detailpagina laatst gewijzigd op 2024-03-08T15:28:43+01:00 (Amsterdam)
ISBN/EAN: 0471731722
ISBN - alternatieve schrijfwijzen:
0-471-73172-2, 978-0-471-73172-6
alternatieve schrijfwijzen en verwante zoekwoorden:
Auteur van het boek: rosa peter, guiseppe, peter rauch, stewart, peter spain, rosa giuseppe, vollertsen rolf, volle, strong, vollert
Titel van het boek: cmos technologie, reliability for the technologies, series advanced, reliability wearout mechanisms advanced cmos technologies
Gegevens van de uitgever
Auteur: Alvin W. Strong; Ernest Y. Wu; Rolf-Peter Vollertsen; Jordi Sune; Giuseppe La Rosa; Timothy D. Sullivan; Stewart E. Rauch
Titel: IEEE Press Series on Microelectronic Systems; Reliability Wearout Mechanisms in Advanced CMOS Technologies
Uitgeverij: John Wiley & Sons
624 Bladzijden
Verschijningsjaar: 2009-09-04
Gewicht: 0,966 kg
Taal: Engels
165,00 € (DE)
No longer receiving updates
164mm x 238mm x 33mm
BB; gebunden; Hardcover, Softcover / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Schaltkreise und Komponenten (Bauteile); Quality & Reliability; Schaltkreise - Theorie u. Entwurf; Circuit Theory & Design; Qualität u. Zuverlässigkeit; Schaltkreise - Theorie u. Entwurf / VLSI / ULSI; Electrical & Electronics Engineering; CMOS; Schaltkreistechnik; Circuit Theory & Design / VLSI / ULSI; Technische Zuverlässigkeit; Elektrotechnik u. Elektronik; Qualität u. Zuverlässigkeit; Schaltkreise - Theorie u. Entwurf; Schaltkreise - Theorie u. Entwurf / VLSI / ULSI
A comprehensive treatment of all aspects of CMOS reliability wearout mechanisms This book covers everything students and professionals need to know about CMOS reliability wearout mechanisms, from basic concepts to the tools necessary to conduct reliability tests and analyze the results. It is the first book of its kind to bring together the pertinent physics, equations, and procedures for CMOS technology reliability in one place. Divided into six relatively independent topics, the book covers: * Introduction to Reliability * Gate Dielectric Reliability * Negative Bias Temperature Instability * Hot Carrier Injection * Electromigration Reliability * Stress Voiding Chapters conclude with practical appendices that provide very basic experimental procedures for readers who are conducting reliability experiments for the first time. Reliability Wearout Mechanisms in Advanced CMOS Technologies is ideal for students and new engineers who are looking to gain a working understanding of CMOS technology reliability. It is also suitable as a professional reference for experienced circuit design engineers, device design engineers, and process engineers.Andere boeken die eventueel grote overeenkomsten met dit boek kunnen hebben:
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