Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide - gebonden uitgave, pocketboek
ISBN: 9781461422686
This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations… Meer...
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ISBN: 9781461422686
This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations… Meer...
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ISBN: 9781461422686
This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations… Meer...
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Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide - gebonden uitgave, pocketboek
2012, ISBN: 146142268X
2013 Gebundene Ausgabe Elektronik, CustomIntegratedCircuits; IntegratedCircuits; ResilientVLSICircuits; Statisticalprocessvariations; Variation-AwareCAD; Variation-awareIntegratedCircui… Meer...
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Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide - gebonden uitgave, pocketboek
ISBN: 9781461422686
Hardback, [PU: Springer-Verlag New York Inc.], This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm an… Meer...
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Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide - gebonden uitgave, pocketboek
ISBN: 9781461422686
This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations… Meer...
ISBN: 9781461422686
This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations… Meer...
ISBN: 9781461422686
This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations… Meer...
Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide - gebonden uitgave, pocketboek
2012, ISBN: 146142268X
2013 Gebundene Ausgabe Elektronik, CustomIntegratedCircuits; IntegratedCircuits; ResilientVLSICircuits; Statisticalprocessvariations; Variation-AwareCAD; Variation-awareIntegratedCircui… Meer...
Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide - gebonden uitgave, pocketboek
ISBN: 9781461422686
Hardback, [PU: Springer-Verlag New York Inc.], This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm an… Meer...
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Gedetalleerde informatie over het boek. - Variation-aware Design Of Custom Integrated Circuits: A Hands-on Field Guide
EAN (ISBN-13): 9781461422686
ISBN (ISBN-10): 146142268X
Gebonden uitgave
Verschijningsjaar: 2013
Uitgever: Springer-Verlag New York Inc.
204 Bladzijden
Gewicht: 0,473 kg
Taal: Englisch
Boek bevindt zich in het datenbestand sinds 2008-12-01T04:10:29+01:00 (Amsterdam)
Detailpagina laatst gewijzigd op 2024-03-02T12:30:12+01:00 (Amsterdam)
ISBN/EAN: 146142268X
ISBN - alternatieve schrijfwijzen:
1-4614-2268-X, 978-1-4614-2268-6
alternatieve schrijfwijzen en verwante zoekwoorden:
Auteur van het boek: dyck, kristopher, kristo, gupta, james hogan
Titel van het boek: field guide, hand, trent, few hands, variation, integrated circuits
Gegevens van de uitgever
Auteur: Trent McConaghy; Kristopher Breen; Jeffrey Dyck; Amit Gupta
Titel: Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide
Uitgeverij: Springer; Springer US
188 Bladzijden
Verschijningsjaar: 2012-09-28
New York; NY; US
Gedrukt / Gemaakt in
Gewicht: 4,321 kg
Taal: Engels
139,09 € (DE)
142,99 € (AT)
153,50 CHF (CH)
POD
XVI, 188 p.
BB; Circuits and Systems; Hardcover, Softcover / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Schaltkreise und Komponenten (Bauteile); Verstehen; Custom Integrated Circuits; Integrated Circuits; Resilient VLSI Circuits; Statistical process variations; Variation-Aware CAD; Variation-Aware Integrated Circuit Design; Variation-Tolerant Integrated Circuit Design; Electronics and Microelectronics, Instrumentation; Nanotechnology and Microengineering; Electronic Circuits and Systems; Electronics and Microelectronics, Instrumentation; Microsystems and MEMS; Elektronik; BC; EA
This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations, environmental variations, and layout effects. The authors have created a field guide to show how to handle variation proactively, and to understand the benefits of doing so. Readers facing variation challenges in their memory, standard cell, analog/RF, and custom digital designs will find easy-to-read, pragmatic solutions. Reviews the most important concepts in variation-aware design, including types of variables and variation, useful variation-aware design terminology, and an overview and comparison of high-level design flows.Describes and compares a suite of approaches and flows for PVT corner-driven design and verification. Presents Fast PVT, a novel, confidence-driven global optimization technique for PVT corner extraction and verification that is both rapid and reliable.Presents a visually-oriented overview of probability density functions, Monte Carlo sampling, and yield estimation.Describes a suite of methods used for 2-3 sigma statistical design and presents a novel sigma-driven corners flow, which is a fast, accurate, and scalable method suitable for 2-3 sigma design and verification.Describes and compares high-sigma design and verification techniques and presents a novel technique for high-sigma statistical corner extraction and verification, demonstrating its fast, accurate, scalable, and verifiable qualities across a variety of applications.Compares manual design and automated sizing and introduces an integrated approach to aid the sizing step in PVT, 3σ statistical and high-sigma statistical design.Andere boeken die eventueel grote overeenkomsten met dit boek kunnen hebben:
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