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Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide - Trent McConaghy & Kristopher Breen & Jeffrey Dyck & Amit Gupta
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Trent McConaghy & Kristopher Breen & Jeffrey Dyck & Amit Gupta:

Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide - gebonden uitgave, pocketboek

ISBN: 9781461422686

This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations… Meer...

Nr. A1019418990. Verzendingskosten:Lieferzeiten außerhalb der Schweiz 3 bis 21 Werktage, , Versandfertig innert 6 - 9 Werktagen, zzgl. Versandkosten. (EUR 17.51)
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ISBN: 9781461422686

This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations… Meer...

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Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide - nieuw boek

ISBN: 9781461422686

This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations… Meer...

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Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide - McConaghy, Trent; Gupta, Amit; Dyck, Jeffrey; Breen, Kristopher
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McConaghy, Trent; Gupta, Amit; Dyck, Jeffrey; Breen, Kristopher:
Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide - gebonden uitgave, pocketboek

2012, ISBN: 146142268X

2013 Gebundene Ausgabe Elektronik, CustomIntegratedCircuits; IntegratedCircuits; ResilientVLSICircuits; Statisticalprocessvariations; Variation-AwareCAD; Variation-awareIntegratedCircui… Meer...

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Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide - Trent McConaghy
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Trent McConaghy:
Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide - gebonden uitgave, pocketboek

ISBN: 9781461422686

Hardback, [PU: Springer-Verlag New York Inc.], This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm an… Meer...

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Variation-aware Design Of Custom Integrated Circuits: A Hands-on Field Guide

This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations, environmental variations, and layout effects.  It teaches them the state-of-the-art in Variation-Aware Design tools, which help the designer to analyze quickly the variation effects, identify the problems, and fix the problems. Furthermore, this book describes the algorithms and algorithm behavior/performance/limitations, which is of use to designers considering these tools, designers using these tools, CAD researchers, and CAD managers.

Gedetalleerde informatie over het boek. - Variation-aware Design Of Custom Integrated Circuits: A Hands-on Field Guide


EAN (ISBN-13): 9781461422686
ISBN (ISBN-10): 146142268X
Gebonden uitgave
Verschijningsjaar: 2013
Uitgever: Springer-Verlag New York Inc.
204 Bladzijden
Gewicht: 0,473 kg
Taal: Englisch

Boek bevindt zich in het datenbestand sinds 2008-12-01T04:10:29+01:00 (Amsterdam)
Detailpagina laatst gewijzigd op 2024-03-02T12:30:12+01:00 (Amsterdam)
ISBN/EAN: 146142268X

ISBN - alternatieve schrijfwijzen:
1-4614-2268-X, 978-1-4614-2268-6
alternatieve schrijfwijzen en verwante zoekwoorden:
Auteur van het boek: dyck, kristopher, kristo, gupta, james hogan
Titel van het boek: field guide, hand, trent, few hands, variation, integrated circuits


Gegevens van de uitgever

Auteur: Trent McConaghy; Kristopher Breen; Jeffrey Dyck; Amit Gupta
Titel: Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide
Uitgeverij: Springer; Springer US
188 Bladzijden
Verschijningsjaar: 2012-09-28
New York; NY; US
Gedrukt / Gemaakt in
Gewicht: 4,321 kg
Taal: Engels
139,09 € (DE)
142,99 € (AT)
153,50 CHF (CH)
POD
XVI, 188 p.

BB; Circuits and Systems; Hardcover, Softcover / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Schaltkreise und Komponenten (Bauteile); Verstehen; Custom Integrated Circuits; Integrated Circuits; Resilient VLSI Circuits; Statistical process variations; Variation-Aware CAD; Variation-Aware Integrated Circuit Design; Variation-Tolerant Integrated Circuit Design; Electronics and Microelectronics, Instrumentation; Nanotechnology and Microengineering; Electronic Circuits and Systems; Electronics and Microelectronics, Instrumentation; Microsystems and MEMS; Elektronik; BC; EA

This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations, environmental variations, and layout effects.  The authors have created a field guide to show how to handle variation proactively, and to understand the benefits of doing so. Readers facing variation challenges in their memory, standard cell, analog/RF, and custom digital designs will find easy-to-read, pragmatic solutions.  Reviews the most important concepts in variation-aware design, including types of variables and variation, useful variation-aware design terminology, and an overview and comparison of high-level design flows.Describes and compares a suite of approaches and flows for PVT corner-driven design and verification. Presents Fast PVT, a novel, confidence-driven global optimization technique for PVT corner extraction and verification that is both rapid and reliable.Presents a visually-oriented overview of probability density functions, Monte Carlo sampling, and yield estimation.Describes a suite of methods used for 2-3 sigma statistical design and presents a novel sigma-driven corners flow, which is a fast, accurate, and scalable method suitable for 2-3 sigma design and verification.Describes and compares high-sigma design and verification techniques and presents a novel technique for high-sigma statistical corner extraction and verification, demonstrating its fast, accurate, scalable, and verifiable qualities across a variety of applications.Compares manual design and automated sizing and introduces an integrated approach to aid the sizing step in PVT, 3σ statistical and high-sigma statistical design.

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