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ISBN: 9783642141034

This volume collects recent works on weakly dependent, long-memory and multifractal processes and introduces new dependence measures for studying complex stochastic systems. Other topics … Meer...

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Dependence in Probability and Statistics - nieuw boek

ISBN: 9783642141034

This volume collects recent works on weakly dependent, long-memory and multifractal processes and introduces new dependence measures for studying complex stochastic systems. Other topics … Meer...

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Abhängigkeit in Wahrscheinlichkeit und Statistik - 9783642141034 - Paul Doukhan, Gabriel Lang, Gilles Teyssiere, Donatas Surgailis
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Abhängigkeit in Wahrscheinlichkeit und Statistik - 9783642141034 - pocketboek

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ISBN-13: 9783642141034, 978-3642141034. Dependence in Probability and Statistics. These results are of interest for describing the asymptotic properties of bootstrap and permutation stati… Meer...

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2010, ISBN: 364214103X

This account of recent works on weakly dependent, long memory and multifractal processes introduces new dependence measures for studying complex stochastic systems and includes other topi… Meer...

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Paul Doukhan:
Dependence in Probability and Statistics Lecture Notes in Statistics, Volume 200 - pocketboek

2010, ISBN: 364214103X

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Dependence in Probability and Statistics

This volume collects recent works on weakly dependent, long-memory and multifractal processes and introduces new dependence measures for studying complex stochastic systems. Other topics include the statistical theory for bootstrap and permutation statistics for infinite variance processes, the dependence structure of max-stable processes, and the statistical properties of spectral estimators of the long memory parameter. The asymptotic behavior of Fejér graph integrals and their use for proving central limit theorems for tapered estimators are investigated. New multifractal processes are introduced and their multifractal properties analyzed. Wavelet-based methods are used to study multifractal processes with different multiresolution quantities, and to detect changes in the variance of random processes. Linear regression models with long-range dependent errors are studied, as is the issue of detecting changes in their parameters.

Gedetalleerde informatie over het boek. - Dependence in Probability and Statistics


EAN (ISBN-13): 9783642141034
ISBN (ISBN-10): 364214103X
Gebonden uitgave
pocket book
Verschijningsjaar: 2010
Uitgever: Springer
205 Bladzijden
Gewicht: 0,348 kg
Taal: eng/Englisch

Boek bevindt zich in het datenbestand sinds 2007-07-06T17:27:14+02:00 (Amsterdam)
Detailpagina laatst gewijzigd op 2023-09-23T12:50:22+02:00 (Amsterdam)
ISBN/EAN: 9783642141034

ISBN - alternatieve schrijfwijzen:
3-642-14103-X, 978-3-642-14103-4
alternatieve schrijfwijzen en verwante zoekwoorden:
Auteur van het boek: teyssiere, paul lang, gilles, doukhan, paul gille, von lang, paul don, teyssié, tey, gill paul
Titel van het boek: probability and statistics, dependence probability


Gegevens van de uitgever

Auteur: Paul Doukhan; Gabriel Lang; Donatas Surgailis; Gilles Teyssière
Titel: Lecture Notes in Statistics; Dependence in Probability and Statistics
Uitgeverij: Springer; Springer Berlin
205 Bladzijden
Verschijningsjaar: 2010-08-11
Berlin; Heidelberg; DE
Gedrukt / Gemaakt in
Taal: Engels
53,49 € (DE)
54,99 € (AT)
59,00 CHF (CH)
POD
XV, 205 p. 13 illus.

BC; Hardcover, Softcover / Mathematik/Wahrscheinlichkeitstheorie, Stochastik, Mathematische Statistik; Wahrscheinlichkeitsrechnung und Statistik; Verstehen; Mathematik; Estimator; Measure; STATISTICA; bootstrap; change-point detection; linear regression; long memory; multifractality; wavelets; weak dependence; Probability Theory; Computational Mathematics and Numerical Analysis; Statistics and Computing; Statistical Theory and Methods; Stochastik; Numerische Mathematik; Mathematische und statistische Software; EA

This volume collects recent works on weakly dependent, long-memory and multifractal processes and introduces new dependence measures for studying complex stochastic systems. Other topics include the statistical theory for bootstrap and permutation statistics for infinite variance processes, the dependence structure of max-stable processes, and the statistical properties of spectral estimators of the long memory parameter. The asymptotic behavior of Fejér graph integrals and their use for proving central limit theorems for tapered estimators are investigated. New multifractal processes are introduced and their multifractal properties analyzed. Wavelet-based methods are used to study multifractal processes with different multiresolution quantities, and to detect changes in the variance of random processes. Linear regression models with long-range dependent errors are studied, as is the issue of detecting changes in their parameters.
This volume provides the reader with a comprehensive recent account on dependent stochastic processes This book is a reference book for theoretical works, and provides some results that are of straight practical interest for the applied statistician/econometrician Includes supplementary material: sn.pub/extras

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