Transmission Electron Microscopy and Diffractometry of Materials | James Howe (u. a.) | Buch | Graduate Texts in Physics | HC runder Rücken kaschiert | XX | Englisch | 2012 | Springer Berlin - gebonden uitgave, pocketboek
2012, ISBN: 9783642297601
[ED: Gebunden], [PU: Springer Berlin], This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of … Meer...
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Transmission Electron Microscopy and Diffractometry of Materials (Graduate Texts in Physics) - gebonden uitgave, pocketboek
2012, ISBN: 9783642297601
Springer, Gebundene Ausgabe, Auflage: 4th ed. 2013, 784 Seiten, Publiziert: 2012-10-14T00:00:01Z, Produktgruppe: Buch, Hersteller-Nr.: biography, 12.88 kg, Verkaufsrang: 2428090, Maschine… Meer...
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Transmission Electron Microscopy and Diffractometry of Materials (Graduate Texts in Physics) - gebonden uitgave, pocketboek
2012, ISBN: 9783642297601
Springer, Gebundene Ausgabe, Auflage: 4th ed. 2013, 784 Seiten, Publiziert: 2012-10-14T00:00:01Z, Produktgruppe: Buch, Hersteller-Nr.: biography, 12.88 kg, Verkaufsrang: 2428090, Maschine… Meer...
amazon.de |
Transmission Electron Microscopy and Diffractometry of Materials (Graduate Texts in Physics) - gebonden uitgave, pocketboek
2012, ISBN: 9783642297601
Springer, Gebundene Ausgabe, Auflage: 4th ed. 2013, 784 Seiten, Publiziert: 2012-10-14T00:00:01Z, Produktgruppe: Buch, Hersteller-Nr.: biography, 12.88 kg, Verkaufsrang: 2428090, Maschine… Meer...
amazon.de Verzendingskosten:Le spese di spedizione possono differire dai costi effettivi. (EUR 3.00) Details... |
2012, ISBN: 3642297609
This book explains aspects of transmission electron microscopy and x-ray diffractometry that are important for characterization of materials. The 4th edition adds new techniques such as e… Meer...
Weltbild.de Nr. 38364015. Verzendingskosten:, 2-5 Werktage, zzgl. Versandkosten. (EUR 14.95) Details... |
Transmission Electron Microscopy and Diffractometry of Materials | James Howe (u. a.) | Buch | Graduate Texts in Physics | HC runder Rücken kaschiert | XX | Englisch | 2012 | Springer Berlin - gebonden uitgave, pocketboek
2012, ISBN: 9783642297601
[ED: Gebunden], [PU: Springer Berlin], This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of … Meer...
Fultz, Brent, Howe, James:
Transmission Electron Microscopy and Diffractometry of Materials (Graduate Texts in Physics) - gebonden uitgave, pocketboek2012, ISBN: 9783642297601
Springer, Gebundene Ausgabe, Auflage: 4th ed. 2013, 784 Seiten, Publiziert: 2012-10-14T00:00:01Z, Produktgruppe: Buch, Hersteller-Nr.: biography, 12.88 kg, Verkaufsrang: 2428090, Maschine… Meer...
Transmission Electron Microscopy and Diffractometry of Materials (Graduate Texts in Physics) - gebonden uitgave, pocketboek
2012
ISBN: 9783642297601
Springer, Gebundene Ausgabe, Auflage: 4th ed. 2013, 784 Seiten, Publiziert: 2012-10-14T00:00:01Z, Produktgruppe: Buch, Hersteller-Nr.: biography, 12.88 kg, Verkaufsrang: 2428090, Maschine… Meer...
Transmission Electron Microscopy and Diffractometry of Materials (Graduate Texts in Physics) - gebonden uitgave, pocketboek
2012, ISBN: 9783642297601
Springer, Gebundene Ausgabe, Auflage: 4th ed. 2013, 784 Seiten, Publiziert: 2012-10-14T00:00:01Z, Produktgruppe: Buch, Hersteller-Nr.: biography, 12.88 kg, Verkaufsrang: 2428090, Maschine… Meer...
2012, ISBN: 3642297609
This book explains aspects of transmission electron microscopy and x-ray diffractometry that are important for characterization of materials. The 4th edition adds new techniques such as e… Meer...
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Gedetalleerde informatie over het boek. - Transmission Electron Microscopy and Diffractometry of Materials (Graduate Texts in Physics)
EAN (ISBN-13): 9783642297601
ISBN (ISBN-10): 3642297609
Gebonden uitgave
Verschijningsjaar: 2012
Uitgever: Springer
761 Bladzijden
Gewicht: 1,318 kg
Taal: Englisch
Boek bevindt zich in het datenbestand sinds 2009-04-07T22:49:51+02:00 (Amsterdam)
Detailpagina laatst gewijzigd op 2024-03-06T11:19:57+01:00 (Amsterdam)
ISBN/EAN: 9783642297601
ISBN - alternatieve schrijfwijzen:
3-642-29760-9, 978-3-642-29760-1
alternatieve schrijfwijzen en verwante zoekwoorden:
Auteur van het boek: james, howe, jam, brent, fultz
Titel van het boek: texts and transmission, micro, electron microscopy materials, material, text and transmission, graduate texts physics
Gegevens van de uitgever
Auteur: Brent Fultz; James Howe
Titel: Graduate Texts in Physics; Transmission Electron Microscopy and Diffractometry of Materials
Uitgeverij: Springer; Springer Berlin
764 Bladzijden
Verschijningsjaar: 2012-10-14
Berlin; Heidelberg; DE
Gedrukt / Gemaakt in
Taal: Engels
117,69 € (DE)
120,99 € (AT)
130,00 CHF (CH)
POD
XX, 764 p.
BB; Hardcover, Softcover / Chemie/Physikalische Chemie; Spektroskopie, Spektrochemie, Massenspektrometrie; Verstehen; Physik; Characterization of Materials; Dark-Field and Bright-Field Imaging; Diffraction and Imaging; Diffraction from Crystals; Imaging Lens Systems; Neutron Scattering; Small-Angle Scattering; Theory of Electron Microscopy and X-Ray Diffraction; Transmission Electron Microscopy; X-Ray Diffractometry; Spectroscopy; Characterization and Analytical Technique; Surfaces, Interfaces and Thin Film; Surface and Interface and Thin Film; Werkstoffprüfung; Materialwissenschaft; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); BC
Diffraction and X-Ray Powder Diffractometer Problems.- TEM and its Optics Problems.- Neutron Scattering Problems.- Scattering Problems.- Inelastic Electron Scattering and Spectroscopy Problems.- Diffraction from Crystals Sphere Problems.- Electron Diffraction and Crystallography Problems.- Diffraction Contrast in TEM Images Problems.- Diffraction Lineshapes Problems.- Patterson Functions and Diffuse Scattering Problems.- High-Resolution TEM Imaging Problems.- High-Resolution STEM and Related Imaging Techniques Problems.- Dynamical Theory Problems.
Brent Fultz is a Professor of Materials Science and Applied Physics at California Institute of Technology, Pasadena. He is the successful co-author of a book on Transmission Electron Microscopy and Diffractometry of Materials.
James Howe is a Professor of Materials Science and Engineering at the University of Virginia, Charlottesville. He successfully co-authored the book Transmission Electron Microscopy and Diffractometry of Materials.
New edition of successful, well-reviewed textbook Provides an integrated coverage of transmission electron microscopy and x-ray diffractometry Shows how wave radiation probes the structure of materials Supports learning and teaching with numerous problems at the end of each chapter to give students practice with the concepts and practical applications Explains the mathematics needed consistently through the book Helps to extend knowledge by indicating further reading Explains concepts in detail, with no requirement for different reference materials Includes supplementary material: sn.pub/extras
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