2006, ISBN: 9780849322747

Editor: Dorf, Richard C. Contributor: Wei, Bo, Contributor: Haake, Anne R. Contributor: Cruchon-Dupeyrat, Sylvain, Contributor: Kraus, Alan D. Contributor: Hoogers, Gregor, Contributor: M… Meer...

Editor: Dorf, Richard C. Contributor: Wei, Bo, Contributor: Haake, Anne R. Contributor: Cruchon-Dupeyrat, Sylvain, Contributor: Kraus, Alan D. Contributor: Hoogers, Gregor, Contributor: Mancini, Thomas R. Contributor: Keiser, Gerd, Contributor: Marshall, Andrew, Contributor: Geddes, Leslie A. Contributor: Watson, Joseph, Contributor: Demarest, Kenneth R. Contributor: Hemming, Leland H. Contributor: Smith, Rosemary L. Contributor: Zaky, Safwat G. Contributor: Sibul, Leon H. Contributor: Wilamowski, Bogdan M. Contributor: Emadi, Ali, Contributor: Luo, Fang Lin, Contributor: Yanushkevich, Svetlana N. Contributor: Slivovsky, Lynne A. Contributor: Amac, Ayse E. Contributor: Argila, Carl A. Contributor: Robertazzi, Thomas G. Contributor: Fox, Martin D. Contributor: Thallam, Rao S. Contributor: Neuman, Michael R. Contributor: Nelatury, Sudarshan Rao, Contributor: Zhou, Shaohua Kevin, Contributor: Dhillon, B.S. Contributor: Meyyappan, M. Contributor: Schuckers, Stephanie A.C. Contributor: Whitaker, Jerry C. Contributor: Bickart, Theodore A. Contributor: Neudorfer, Paul, Contributor: Gildenblat, Gennady, Contributor: Nessmith, Josh T. Contributor: Batalama, Stella N. Contributor: Gelmont, Boris, Contributor: Blackwell, Glenn R. Contributor: Watson, Neville R. Contributor: Ramakumar, Rama, Contributor: Roy-Chowdhury, Amit K. Contributor: Lavagno, Luciano, Contributor: Johnston, Anna, Contributor: Nolte, Thomas, Contributor: Marks II, Robert J. Contributor: Hamacher, V. Carl, Contributor: Rozanski, Evelyn P. Contributor: Martin, Johannes J. Contributor: Jones, Capers, Contributor: Johnson, Barry W. Contributor: Liebowitz, Jay, Contributor: Guy, Christopher G. Contributor: Lee, Gordon K.F. Contributor: Jacquot, Raymond G. Contributor: Abdelguerfi, Mahdi, Contributor: Brogan, William L. Contributor: Sage, Andrew P. Contributor: Hsia, T. C. Contributor: Tummala, R. Lal, Contributor: Leondes, Cornelius T. Contributor: Martinec, Dan, Contributor: Odrey, Nicholas G. Contributor: Spitzer, Cary R. Contributor: Cook, George E. Contributor: Kayton, Myron, Contributor: Berbari, Edward J. Contributor: Cadzow, James A. Contributor: Bush, Marcia A. Contributor: DiFonzo, Daniel F. Contributor: Maddy, Steven L. Contributor: Tranter, William H. Contributor: Graham, Peter H. Contributor: Cao, Yu, Contributor: Arif, Ronald A. Contributor: Dutta, Mitra, Contributor: Hornak, Lawrence A. Contributor: Elko, Gary W. Contributor: Jin, Zhian, Contributor: Gilbert, James M. Contributor: Constantinides, George A. Contributor: Morrow, Michael G. Contributor: Parthasaradhi, T.V. Sujan, Contributor: Sarkar, Tirthajyoti, Contributor: Mazzola, Michael S. Contributor: Stiegler, Harvey J. Contributor: Su, Wei, Contributor: Sulyman, Ahmad Iyanda, Contributor: Wong, Bert, Contributor: Welch, Thad B. Contributor: Derakshani, Reza, Contributor: Chen, Chih-Ming, Contributor: Khosravani, Reza, Contributor: Dorval, Alan D. Contributor: Boyd, John E. Contributor: Dong, Hui, Contributor: Nagurka, Mark L. Contributor: Akujuobi, Cajetan M. Contributor: Belcher, Melvin, Contributor: Ayers, John E. Contributor: Ye, Hong, Contributor: Martin, Grant, Contributor: Kaiser, Kenneth L. Contributor: Passas, Nikos, Contributor: Ucinski, Dariusz, Contributor: Mazumder, Sudip K. Contributor: Shmerko, Vlad P. Contributor: Seker, Remzi, Contributor: Schaller, Nan C. Contributor: Martinez, David R. Contributor: Thramboulidis, Kleanthis, Contributor: Nolin, Mikael, Contributor: Cohen, Israel, Contributor: Liddicoat, Albert A. Contributor: Avery, Wiliam, Contributor: Yimnirun, Rattikorn, Contributor: Rabinkin, Daniel V. Contributor: Basunia, Mahmudunnabi, Contributor: Tansu, Nelson, Contributor: Park, Benjamin Y. Contributor: Zaouk, Rabih, Contributor: Bond, Robert A. Contributor: Blazek, Michele, Contributor: Moffett, Mark B. Contributor: Sherman, Charles H. Contributor: Krusienski, Dean J. Contributor: Ferdowsi, Mehdi, Contributor: Phadke, Arun G. Contributor: Glover, J. Duncan, Contributor: Bose, Anjan, Contributor: Lindsey III, Jeffrey F. Contributor: El-Hawary, Mohamed E. Contributor: Gungor, R. B. Contributor: Gross, Charles A. Contributor: Galler, Donald, Contributor: Stanton, K. Neil, Contributor: Roden, Martin S. Contributor: Clegg, Almon H. Contributor: Palais, Joseph C. Contributor: Salek, Stanley, Contributor: Darcie, Ted E. Contributor: Robrock II, Richard B. Contributor: Sandige, Richard S. Contributor: Pricer, W. David, Contributor: Lee, Peter A. Contributor: Bannister, Brian R. Contributor: Carroll, Bill D. Contributor: Dervisoglu, Bulent I. Contributor: Staudhammer, John, Contributor: Morris, James E. Contributor: Serra, Michaela, Contributor: Tinder, Richard, Contributor: Raymond, Jacques, Contributor: Lewis, Ted G. Contributor: Feisel, Lyle Dean, Contributor: Kersting, William H. Contributor: Barnes, Frank S. Contributor: Rollins, J. Gregory, Contributor: Atherton, Derek P. Contributor: Soclof, Sidney, Contributor: Delin, Kevin A. Contributor: Tewksbury, Stuart K. Contributor: Bomar, Bruce W. Contributor: Bendix, Peter, Contributor: Dewey, Allen M. Contributor: Jenkins, W. Kenneth, Contributor: Nise, Norman S. Contributor: Daigle, John N. Contributor: Poor, H. Vincent, Contributor: Feldman, James M. Contributor: Boehmer, Linda Sue, Contributor: Newnham, Robert E. Contributor: Principe, Jose C. Contributor: Sundar, Veeraraghavan, Contributor: Arrillaga, Jos, Contributor: Blades, Karen, Contributor: Grigsby, Leonard L. Contributor: Eskicioglu, Rasit, Contributor: Arnold, Christopher P. Contributor: McClellan, Stan, Contributor: Verdu, Sergio, Contributor: Strangas, Elias G. Contributor: Allenby, Braden, Contributor: Brewer, Joe E. Contributor: Hanson, Andrew, Contributor: Ilyas, Mohammad, Contributor: Barr, R.C. Contributor: Madou, Marc J. Contributor: Horan, Stephen, Contributor: Jenkins, Hodge E. Contributor: Cooper, Arlin J. Contributor: Kraetzl, Miroslav, Contributor: Zurawski, Richard, Contributor: Zomaya, Albert Y. Contributor: Sondhi, Mohan M. Contributor: Eren, Halit, Contributor: Therrien, Charles W. Contributor: ElAli, Taan, Contributor: Balkir, Sina, Contributor: Reed, Todd R. Contributor: Piguet, Christian, Contributor: Pelesko, John A. Contributor: Giurgiutiu, Victor, Contributor: Short, Thomas Allen, Contributor: Rogers, Peter H. Contributor: Orlando, Terry P. Contributor: Bartnikas, Ray, Contributor: Young, David, Contributor: Karady, George, Contributor: Mansuripur, Masud, Contributor: Windley, Phillip, Contributor: Preparata, Franco P. Contributor: Weber, Larry, Contributor: Andersen, Kristinn, Contributor: Ballou, Glen, Contributor: Barnett, Robert Joel, Contributor: Bitler, William, Contributor: Bronzino, Joseph D. Contributor: Ciletti, Michael D. Contributor: Czeck, Edward W. Contributor: Doelitzsch, Dennis F. Contributor: Frenzel, James F. Contributor: Giri, Jay C. Contributor: Harbor, Royce D. Contributor: Kolias, Nicholas J. Contributor: Kosbar, Kurt L. Contributor: Kurumbalapitiya, Dhammika, Contributor: Lall, Pradeep, Contributor: Lasky, Ty A. Contributor: McInroy, John E. Contributor: Pu, Yuan, Contributor: Sherr, Solomon, Contributor: Shim, Theodore I. Contributor: Smith, L. Montgomery, Contributor: Sworder, David D. Contributor: Thomas, Joy A. Contributor: Tragoudas, Spyros, Contributor: Vranesic, Zvonko G. Contributor: Wan, Zhen, Contributor: Whitehead, Donald G. Contributor: Looney, Carl G. Contributor: Cover, Thomas, Contributor: Hinton, Harvard S. Contributor: Moss, Gregory L. Contributor: Etter, Delores M. Contributor: Pecht, Michael, Contributor: Sankaran, C. Contributor: Cogdell, J.R. Contributor: Irwin, J. David, Contributor: Chan, Shu-Park, Contributor: Angelopoulos C.E.T., Nick, Contributor: Balabanian, Norman, Contributor: Kerwin, William J. Contributor: Hudgins, Jerry L. Contributor: Mayaram, Kartikeya, Contributor: Gibson, Jerry D. Contributor: Bogart, Theodore F. Contributor: Johnson, David E. Contributor: Ephraim, Yariv, Contributor: Pillai, S. Unnikrishna, Contributor: Bose, Bimal K. Contributor: Chassaing, Rulph, Contributor: Milkovic, Miram, Contributor: Kazakos, Demetrios, Contributor: Rajala, Sara, Contributor: Parhi, Keshab K. Contributor: Schroeter, Juergen, Contributor: Stephenson, F. William, Contributor: Elshabini, Aicha, Contributor: Parks, Harold G. Contributor: Brews, John, Contributor: Choma Jr., John, Contributor: Needham, Wayne, Contributor: Rajaram, S. Contributor: Zargham, Mehdi R. Contributor: Kennedy, Eldredge J. Contributor: Carpenter, Gordon L. Contributor: Rajashekara, Kaushik S. Contributor: Watkins, Laurence S. Contributor: Steadman, John W. Contributor: Bhat, Ashoka K.S. Contributor: Hecht, Jeff, Contributor: Becker, Richard A. Contributor: Bate, Geoffrey, Contributor: Fitch, J. Patrick, Contributor: Trew, Robert, Contributor: Agbo, Samuel O. Contributor: Bahl, Inder J. Contributor: Compton, Richard C. Contributor: Steer, Michael, Contributor: Wiltse, James C. Contributor: Messenger, Roger, Contributor: Ventre, Jerry, Contributor: Vai, M. Michael, Contributor: Sherif, Mostafa Hashem, Contributor: Lyshevski, Sergey Edward, Contributor: Llinas, James, Contributor: Feng, Tse-yun, Contributor: Szidarovszky, Ferenc, Contributor: Chen, Wai-Kai, Contributor: Etzold, Karl F. Contributor: Ehrlich, Alexander, Contributor: Boldea, Ion, Contributor: Jorgensen, Paul C. Contributor: Willner, Alan E. Contributor: Kurfess, Thomas R. Contributor: Finkel, Raphael A. Contributor: Phillips, Charles, Contributor: Khalilieh, Sam S. Contributor: Shi, Yun Q. Contributor: Ozbay, Hitay, Contributor: Attia, John Okyere, Contributor: Hall, David L. Contributor: Tuzlukov, Vyacheslav, Contributor: Strauss, Alvin M. Contributor: Relf, Christopher G. Contributor: Ives, Robert W. Contributor: Salkintzis, Apostolis K. Contributor: Ibnkahla, Mohamed, Contributor: Piper, Samuel O. Contributor: Hansson, Hans, Contributor: Enslin, Johan H. R. Contributor: Chellappa, Rama, Contributor: Crawford, Reginald, Contributor: Delapp, David R. Contributor: Du, Yingzi, Contributor: Kim, Yong Deak, Contributor: Robertson, Ian D. Contributor: Tayahi, Moncef Benjamin, Contributor: Wright, Cameron H.G. Contributor: Yoon, Won-Sik, Contributor: Xiong, Ping, Contributor: Musa, Sarhan, Contributor: Qian, Haoli, Contributor: Serban, Ioan, Contributor: White, John A. Contributor: Lee, Young Choon, Contributor: Maharatna, Koushik, Contributor: Hobbs, Bryan, Contributor: Kryder, Mark H. Contributor: Tallarida, Ronald J. Contributor: Uman, Martin A. Contributor: Paul, Clayton R. Contributor: Sadiku, Matthew N.O. Contributor: Bahill, A. Terry, Contributor: Wilcox, Lynn D. Contributor: Bose, N.K. Contributor: Oldfield, John Victor, Contributor: Rawat, Banmali S. Contributor: Shaw, Leonard G. Contributor: Poularikas, Alexander D. Series Editor: Dorf, Richard C. CRC Press, Hardcover, Auflage: 3, 3672 Seiten, Publiziert: 2006-01-20T00:00:01Z, Produktgruppe: Book, 6.95 kg, Verkaufsrang: 3656074, Books Global Store, Special Features, Books, Computing & Internet, Subjects, Environmental, Civil Engineering, Engineering & Technology, Science, Nature & Maths, Electrical Engineering, Electronics Engineering, Electronics & Communications Engineering, Energy Technology, Reference, Mathematics, Electromagnetism, Physics, Scientific, Technical & Medical, Environmental Engineering, Format: Illustrated, CRC Press, 2006<

2006, ISBN: 9780849322747

Editor: Dorf, Richard C. Contributor: Wei, Bo, Contributor: Haake, Anne R. Contributor: Cruchon-Dupeyrat, Sylvain, Contributor: Kraus, Alan D. Contributor: Hoogers, Gregor, Contributor: M… Meer...

Editor: Dorf, Richard C. Contributor: Wei, Bo, Contributor: Haake, Anne R. Contributor: Cruchon-Dupeyrat, Sylvain, Contributor: Kraus, Alan D. Contributor: Hoogers, Gregor, Contributor: Mancini, Thomas R. Contributor: Keiser, Gerd, Contributor: Marshall, Andrew, Contributor: Geddes, Leslie A. Contributor: Watson, Joseph, Contributor: Demarest, Kenneth R. Contributor: Hemming, Leland H. Contributor: Smith, Rosemary L. Contributor: Zaky, Safwat G. Contributor: Sibul, Leon H. Contributor: Wilamowski, Bogdan M. Contributor: Emadi, Ali, Contributor: Luo, Fang Lin, Contributor: Yanushkevich, Svetlana N. Contributor: Slivovsky, Lynne A. Contributor: Amac, Ayse E. Contributor: Argila, Carl A. Contributor: Robertazzi, Thomas G. Contributor: Fox, Martin D. Contributor: Thallam, Rao S. Contributor: Neuman, Michael R. Contributor: Nelatury, Sudarshan Rao, Contributor: Zhou, Shaohua Kevin, Contributor: Dhillon, B.S. Contributor: Meyyappan, M. Contributor: Schuckers, Stephanie A.C. Contributor: Whitaker, Jerry C. Contributor: Bickart, Theodore A. Contributor: Neudorfer, Paul, Contributor: Gildenblat, Gennady, Contributor: Nessmith, Josh T. Contributor: Batalama, Stella N. Contributor: Gelmont, Boris, Contributor: Blackwell, Glenn R. Contributor: Watson, Neville R. Contributor: Ramakumar, Rama, Contributor: Roy-Chowdhury, Amit K. Contributor: Lavagno, Luciano, Contributor: Johnston, Anna, Contributor: Nolte, Thomas, Contributor: Marks II, Robert J. Contributor: Hamacher, V. Carl, Contributor: Rozanski, Evelyn P. Contributor: Martin, Johannes J. Contributor: Jones, Capers, Contributor: Johnson, Barry W. Contributor: Liebowitz, Jay, Contributor: Guy, Christopher G. Contributor: Lee, Gordon K.F. Contributor: Jacquot, Raymond G. Contributor: Abdelguerfi, Mahdi, Contributor: Brogan, William L. Contributor: Sage, Andrew P. Contributor: Hsia, T. C. Contributor: Tummala, R. Lal, Contributor: Leondes, Cornelius T. Contributor: Martinec, Dan, Contributor: Odrey, Nicholas G. Contributor: Spitzer, Cary R. Contributor: Cook, George E. Contributor: Kayton, Myron, Contributor: Berbari, Edward J. Contributor: Cadzow, James A. Contributor: Bush, Marcia A. Contributor: DiFonzo, Daniel F. Contributor: Maddy, Steven L. Contributor: Tranter, William H. Contributor: Graham, Peter H. Contributor: Cao, Yu, Contributor: Arif, Ronald A. Contributor: Dutta, Mitra, Contributor: Hornak, Lawrence A. Contributor: Elko, Gary W. Contributor: Jin, Zhian, Contributor: Gilbert, James M. Contributor: Constantinides, George A. Contributor: Morrow, Michael G. Contributor: Parthasaradhi, T.V. Sujan, Contributor: Sarkar, Tirthajyoti, Contributor: Mazzola, Michael S. Contributor: Stiegler, Harvey J. Contributor: Su, Wei, Contributor: Sulyman, Ahmad Iyanda, Contributor: Wong, Bert, Contributor: Welch, Thad B. Contributor: Derakshani, Reza, Contributor: Chen, Chih-Ming, Contributor: Khosravani, Reza, Contributor: Dorval, Alan D. Contributor: Boyd, John E. Contributor: Dong, Hui, Contributor: Nagurka, Mark L. Contributor: Akujuobi, Cajetan M. Contributor: Belcher, Melvin, Contributor: Ayers, John E. Contributor: Ye, Hong, Contributor: Martin, Grant, Contributor: Kaiser, Kenneth L. Contributor: Passas, Nikos, Contributor: Ucinski, Dariusz, Contributor: Mazumder, Sudip K. Contributor: Shmerko, Vlad P. Contributor: Seker, Remzi, Contributor: Schaller, Nan C. Contributor: Martinez, David R. Contributor: Thramboulidis, Kleanthis, Contributor: Nolin, Mikael, Contributor: Cohen, Israel, Contributor: Liddicoat, Albert A. Contributor: Avery, Wiliam, Contributor: Yimnirun, Rattikorn, Contributor: Rabinkin, Daniel V. Contributor: Basunia, Mahmudunnabi, Contributor: Tansu, Nelson, Contributor: Park, Benjamin Y. Contributor: Zaouk, Rabih, Contributor: Bond, Robert A. Contributor: Blazek, Michele, Contributor: Moffett, Mark B. Contributor: Sherman, Charles H. Contributor: Krusienski, Dean J. Contributor: Ferdowsi, Mehdi, Contributor: Phadke, Arun G. Contributor: Glover, J. Duncan, Contributor: Bose, Anjan, Contributor: Lindsey III, Jeffrey F. Contributor: El-Hawary, Mohamed E. Contributor: Gungor, R. B. Contributor: Gross, Charles A. Contributor: Galler, Donald, Contributor: Stanton, K. Neil, Contributor: Roden, Martin S. Contributor: Clegg, Almon H. Contributor: Palais, Joseph C. Contributor: Salek, Stanley, Contributor: Darcie, Ted E. Contributor: Robrock II, Richard B. Contributor: Sandige, Richard S. Contributor: Pricer, W. David, Contributor: Lee, Peter A. Contributor: Bannister, Brian R. Contributor: Carroll, Bill D. Contributor: Dervisoglu, Bulent I. Contributor: Staudhammer, John, Contributor: Morris, James E. Contributor: Serra, Michaela, Contributor: Tinder, Richard, Contributor: Raymond, Jacques, Contributor: Lewis, Ted G. Contributor: Feisel, Lyle Dean, Contributor: Kersting, William H. Contributor: Barnes, Frank S. Contributor: Rollins, J. Gregory, Contributor: Atherton, Derek P. Contributor: Soclof, Sidney, Contributor: Delin, Kevin A. Contributor: Tewksbury, Stuart K. Contributor: Bomar, Bruce W. Contributor: Bendix, Peter, Contributor: Dewey, Allen M. Contributor: Jenkins, W. Kenneth, Contributor: Nise, Norman S. Contributor: Daigle, John N. Contributor: Poor, H. Vincent, Contributor: Feldman, James M. Contributor: Boehmer, Linda Sue, Contributor: Newnham, Robert E. Contributor: Principe, Jose C. Contributor: Sundar, Veeraraghavan, Contributor: Arrillaga, Jos, Contributor: Blades, Karen, Contributor: Grigsby, Leonard L. Contributor: Eskicioglu, Rasit, Contributor: Arnold, Christopher P. Contributor: McClellan, Stan, Contributor: Verdu, Sergio, Contributor: Strangas, Elias G. Contributor: Allenby, Braden, Contributor: Brewer, Joe E. Contributor: Hanson, Andrew, Contributor: Ilyas, Mohammad, Contributor: Barr, R.C. Contributor: Madou, Marc J. Contributor: Horan, Stephen, Contributor: Jenkins, Hodge E. Contributor: Cooper, Arlin J. Contributor: Kraetzl, Miroslav, Contributor: Zurawski, Richard, Contributor: Zomaya, Albert Y. Contributor: Sondhi, Mohan M. Contributor: Eren, Halit, Contributor: Therrien, Charles W. Contributor: ElAli, Taan, Contributor: Balkir, Sina, Contributor: Reed, Todd R. Contributor: Piguet, Christian, Contributor: Pelesko, John A. Contributor: Giurgiutiu, Victor, Contributor: Short, Thomas Allen, Contributor: Rogers, Peter H. Contributor: Orlando, Terry P. Contributor: Bartnikas, Ray, Contributor: Young, David, Contributor: Karady, George, Contributor: Mansuripur, Masud, Contributor: Windley, Phillip, Contributor: Preparata, Franco P. Contributor: Weber, Larry, Contributor: Andersen, Kristinn, Contributor: Ballou, Glen, Contributor: Barnett, Robert Joel, Contributor: Bitler, William, Contributor: Bronzino, Joseph D. Contributor: Ciletti, Michael D. Contributor: Czeck, Edward W. Contributor: Doelitzsch, Dennis F. Contributor: Frenzel, James F. Contributor: Giri, Jay C. Contributor: Harbor, Royce D. Contributor: Kolias, Nicholas J. Contributor: Kosbar, Kurt L. Contributor: Kurumbalapitiya, Dhammika, Contributor: Lall, Pradeep, Contributor: Lasky, Ty A. Contributor: McInroy, John E. Contributor: Pu, Yuan, Contributor: Sherr, Solomon, Contributor: Shim, Theodore I. Contributor: Smith, L. Montgomery, Contributor: Sworder, David D. Contributor: Thomas, Joy A. Contributor: Tragoudas, Spyros, Contributor: Vranesic, Zvonko G. Contributor: Wan, Zhen, Contributor: Whitehead, Donald G. Contributor: Looney, Carl G. Contributor: Cover, Thomas, Contributor: Hinton, Harvard S. Contributor: Moss, Gregory L. Contributor: Etter, Delores M. Contributor: Pecht, Michael, Contributor: Sankaran, C. Contributor: Cogdell, J.R. Contributor: Irwin, J. David, Contributor: Chan, Shu-Park, Contributor: Angelopoulos C.E.T., Nick, Contributor: Balabanian, Norman, Contributor: Kerwin, William J. Contributor: Hudgins, Jerry L. Contributor: Mayaram, Kartikeya, Contributor: Gibson, Jerry D. Contributor: Bogart, Theodore F. Contributor: Johnson, David E. Contributor: Ephraim, Yariv, Contributor: Pillai, S. Unnikrishna, Contributor: Bose, Bimal K. Contributor: Chassaing, Rulph, Contributor: Milkovic, Miram, Contributor: Kazakos, Demetrios, Contributor: Rajala, Sara, Contributor: Parhi, Keshab K. Contributor: Schroeter, Juergen, Contributor: Stephenson, F. William, Contributor: Elshabini, Aicha, Contributor: Parks, Harold G. Contributor: Brews, John, Contributor: Choma Jr., John, Contributor: Needham, Wayne, Contributor: Rajaram, S. Contributor: Zargham, Mehdi R. Contributor: Kennedy, Eldredge J. Contributor: Carpenter, Gordon L. Contributor: Rajashekara, Kaushik S. Contributor: Watkins, Laurence S. Contributor: Steadman, John W. Contributor: Bhat, Ashoka K.S. Contributor: Hecht, Jeff, Contributor: Becker, Richard A. Contributor: Bate, Geoffrey, Contributor: Fitch, J. Patrick, Contributor: Trew, Robert, Contributor: Agbo, Samuel O. Contributor: Bahl, Inder J. Contributor: Compton, Richard C. Contributor: Steer, Michael, Contributor: Wiltse, James C. Contributor: Messenger, Roger, Contributor: Ventre, Jerry, Contributor: Vai, M. Michael, Contributor: Sherif, Mostafa Hashem, Contributor: Lyshevski, Sergey Edward, Contributor: Llinas, James, Contributor: Feng, Tse-yun, Contributor: Szidarovszky, Ferenc, Contributor: Chen, Wai-Kai, Contributor: Etzold, Karl F. Contributor: Ehrlich, Alexander, Contributor: Boldea, Ion, Contributor: Jorgensen, Paul C. Contributor: Willner, Alan E. Contributor: Kurfess, Thomas R. Contributor: Finkel, Raphael A. Contributor: Phillips, Charles, Contributor: Khalilieh, Sam S. Contributor: Shi, Yun Q. Contributor: Ozbay, Hitay, Contributor: Attia, John Okyere, Contributor: Hall, David L. Contributor: Tuzlukov, Vyacheslav, Contributor: Strauss, Alvin M. Contributor: Relf, Christopher G. Contributor: Ives, Robert W. Contributor: Salkintzis, Apostolis K. Contributor: Ibnkahla, Mohamed, Contributor: Piper, Samuel O. Contributor: Hansson, Hans, Contributor: Enslin, Johan H. R. Contributor: Chellappa, Rama, Contributor: Crawford, Reginald, Contributor: Delapp, David R. Contributor: Du, Yingzi, Contributor: Kim, Yong Deak, Contributor: Robertson, Ian D. Contributor: Tayahi, Moncef Benjamin, Contributor: Wright, Cameron H.G. Contributor: Yoon, Won-Sik, Contributor: Xiong, Ping, Contributor: Musa, Sarhan, Contributor: Qian, Haoli, Contributor: Serban, Ioan, Contributor: White, John A. Contributor: Lee, Young Choon, Contributor: Maharatna, Koushik, Contributor: Hobbs, Bryan, Contributor: Kryder, Mark H. Contributor: Tallarida, Ronald J. Contributor: Uman, Martin A. Contributor: Paul, Clayton R. Contributor: Sadiku, Matthew N.O. Contributor: Bahill, A. Terry, Contributor: Wilcox, Lynn D. Contributor: Bose, N.K. Contributor: Oldfield, John Victor, Contributor: Rawat, Banmali S. Contributor: Shaw, Leonard G. Contributor: Poularikas, Alexander D. Series Editor: Dorf, Richard C. CRC Press, Hardcover, Auflage: 3, 3672 Seiten, Publiziert: 2006-01-20T00:00:01Z, Produktgruppe: Book, 6.95 kg, Verkaufsrang: 3656074, Books Global Store, Special Features, Books, Computing & Internet, Subjects, Environmental, Civil Engineering, Engineering & Technology, Science, Nature & Maths, Electrical Engineering, Electronics Engineering, Electronics & Communications Engineering, Energy Technology, Reference, Mathematics, Electromagnetism, Physics, Scientific, Technical & Medical, Environmental Engineering, Format: Illustrated, CRC Press, 2006<

2006, ISBN: 9780849322747

Editor: Dorf, Richard C. Contributor: Wei, Bo, Contributor: Haake, Anne R. Contributor: Cruchon-Dupeyrat, Sylvain, Contributor: Kraus, Alan D. Contributor: Hoogers, Gregor, Contributor: M… Meer...

Editor: Dorf, Richard C. Contributor: Wei, Bo, Contributor: Haake, Anne R. Contributor: Cruchon-Dupeyrat, Sylvain, Contributor: Kraus, Alan D. Contributor: Hoogers, Gregor, Contributor: Mancini, Thomas R. Contributor: Keiser, Gerd, Contributor: Marshall, Andrew, Contributor: Geddes, Leslie A. Contributor: Watson, Joseph, Contributor: Demarest, Kenneth R. Contributor: Hemming, Leland H. Contributor: Smith, Rosemary L. Contributor: Zaky, Safwat G. Contributor: Sibul, Leon H. Contributor: Wilamowski, Bogdan M. Contributor: Emadi, Ali, Contributor: Luo, Fang Lin, Contributor: Yanushkevich, Svetlana N. Contributor: Slivovsky, Lynne A. Contributor: Amac, Ayse E. Contributor: Argila, Carl A. Contributor: Robertazzi, Thomas G. Contributor: Fox, Martin D. Contributor: Thallam, Rao S. Contributor: Neuman, Michael R. Contributor: Nelatury, Sudarshan Rao, Contributor: Zhou, Shaohua Kevin, Contributor: Dhillon, B.S. Contributor: Meyyappan, M. Contributor: Schuckers, Stephanie A.C. Contributor: Whitaker, Jerry C. Contributor: Bickart, Theodore A. Contributor: Neudorfer, Paul, Contributor: Gildenblat, Gennady, Contributor: Nessmith, Josh T. Contributor: Batalama, Stella N. Contributor: Gelmont, Boris, Contributor: Blackwell, Glenn R. Contributor: Watson, Neville R. Contributor: Ramakumar, Rama, Contributor: Roy-Chowdhury, Amit K. Contributor: Lavagno, Luciano, Contributor: Johnston, Anna, Contributor: Nolte, Thomas, Contributor: Marks II, Robert J. Contributor: Hamacher, V. Carl, Contributor: Rozanski, Evelyn P. Contributor: Martin, Johannes J. Contributor: Jones, Capers, Contributor: Johnson, Barry W. Contributor: Liebowitz, Jay, Contributor: Guy, Christopher G. Contributor: Lee, Gordon K.F. Contributor: Jacquot, Raymond G. Contributor: Abdelguerfi, Mahdi, Contributor: Brogan, William L. Contributor: Sage, Andrew P. Contributor: Hsia, T. C. Contributor: Tummala, R. Lal, Contributor: Leondes, Cornelius T. Contributor: Martinec, Dan, Contributor: Odrey, Nicholas G. Contributor: Spitzer, Cary R. Contributor: Cook, George E. Contributor: Kayton, Myron, Contributor: Berbari, Edward J. Contributor: Cadzow, James A. Contributor: Bush, Marcia A. Contributor: DiFonzo, Daniel F. Contributor: Maddy, Steven L. Contributor: Tranter, William H. Contributor: Graham, Peter H. Contributor: Cao, Yu, Contributor: Arif, Ronald A. Contributor: Dutta, Mitra, Contributor: Hornak, Lawrence A. Contributor: Elko, Gary W. Contributor: Jin, Zhian, Contributor: Gilbert, James M. Contributor: Constantinides, George A. Contributor: Morrow, Michael G. Contributor: Parthasaradhi, T.V. Sujan, Contributor: Sarkar, Tirthajyoti, Contributor: Mazzola, Michael S. Contributor: Stiegler, Harvey J. Contributor: Su, Wei, Contributor: Sulyman, Ahmad Iyanda, Contributor: Wong, Bert, Contributor: Welch, Thad B. Contributor: Derakshani, Reza, Contributor: Chen, Chih-Ming, Contributor: Khosravani, Reza, Contributor: Dorval, Alan D. Contributor: Boyd, John E. Contributor: Dong, Hui, Contributor: Nagurka, Mark L. Contributor: Akujuobi, Cajetan M. Contributor: Belcher, Melvin, Contributor: Ayers, John E. Contributor: Ye, Hong, Contributor: Martin, Grant, Contributor: Kaiser, Kenneth L. Contributor: Passas, Nikos, Contributor: Ucinski, Dariusz, Contributor: Mazumder, Sudip K. Contributor: Shmerko, Vlad P. Contributor: Seker, Remzi, Contributor: Schaller, Nan C. Contributor: Martinez, David R. Contributor: Thramboulidis, Kleanthis, Contributor: Nolin, Mikael, Contributor: Cohen, Israel, Contributor: Liddicoat, Albert A. Contributor: Avery, Wiliam, Contributor: Yimnirun, Rattikorn, Contributor: Rabinkin, Daniel V. Contributor: Basunia, Mahmudunnabi, Contributor: Tansu, Nelson, Contributor: Park, Benjamin Y. Contributor: Zaouk, Rabih, Contributor: Bond, Robert A. Contributor: Blazek, Michele, Contributor: Moffett, Mark B. Contributor: Sherman, Charles H. Contributor: Krusienski, Dean J. Contributor: Ferdowsi, Mehdi, Contributor: Phadke, Arun G. Contributor: Glover, J. Duncan, Contributor: Bose, Anjan, Contributor: Lindsey III, Jeffrey F. Contributor: El-Hawary, Mohamed E. Contributor: Gungor, R. B. Contributor: Gross, Charles A. Contributor: Galler, Donald, Contributor: Stanton, K. Neil, Contributor: Roden, Martin S. Contributor: Clegg, Almon H. Contributor: Palais, Joseph C. Contributor: Salek, Stanley, Contributor: Darcie, Ted E. Contributor: Robrock II, Richard B. Contributor: Sandige, Richard S. Contributor: Pricer, W. David, Contributor: Lee, Peter A. Contributor: Bannister, Brian R. Contributor: Carroll, Bill D. Contributor: Dervisoglu, Bulent I. Contributor: Staudhammer, John, Contributor: Morris, James E. Contributor: Serra, Michaela, Contributor: Tinder, Richard, Contributor: Raymond, Jacques, Contributor: Lewis, Ted G. Contributor: Feisel, Lyle Dean, Contributor: Kersting, William H. Contributor: Barnes, Frank S. Contributor: Rollins, J. Gregory, Contributor: Atherton, Derek P. Contributor: Soclof, Sidney, Contributor: Delin, Kevin A. Contributor: Tewksbury, Stuart K. Contributor: Bomar, Bruce W. Contributor: Bendix, Peter, Contributor: Dewey, Allen M. Contributor: Jenkins, W. Kenneth, Contributor: Nise, Norman S. Contributor: Daigle, John N. Contributor: Poor, H. Vincent, Contributor: Feldman, James M. Contributor: Boehmer, Linda Sue, Contributor: Newnham, Robert E. Contributor: Principe, Jose C. Contributor: Sundar, Veeraraghavan, Contributor: Arrillaga, Jos, Contributor: Blades, Karen, Contributor: Grigsby, Leonard L. Contributor: Eskicioglu, Rasit, Contributor: Arnold, Christopher P. Contributor: McClellan, Stan, Contributor: Verdu, Sergio, Contributor: Strangas, Elias G. Contributor: Allenby, Braden, Contributor: Brewer, Joe E. Contributor: Hanson, Andrew, Contributor: Ilyas, Mohammad, Contributor: Barr, R.C. Contributor: Madou, Marc J. Contributor: Horan, Stephen, Contributor: Jenkins, Hodge E. Contributor: Cooper, Arlin J. Contributor: Kraetzl, Miroslav, Contributor: Zurawski, Richard, Contributor: Zomaya, Albert Y. Contributor: Sondhi, Mohan M. Contributor: Eren, Halit, Contributor: Therrien, Charles W. Contributor: ElAli, Taan, Contributor: Balkir, Sina, Contributor: Reed, Todd R. Contributor: Piguet, Christian, Contributor: Pelesko, John A. Contributor: Giurgiutiu, Victor, Contributor: Short, Thomas Allen, Contributor: Rogers, Peter H. Contributor: Orlando, Terry P. Contributor: Bartnikas, Ray, Contributor: Young, David, Contributor: Karady, George, Contributor: Mansuripur, Masud, Contributor: Windley, Phillip, Contributor: Preparata, Franco P. Contributor: Weber, Larry, Contributor: Andersen, Kristinn, Contributor: Ballou, Glen, Contributor: Barnett, Robert Joel, Contributor: Bitler, William, Contributor: Bronzino, Joseph D. Contributor: Ciletti, Michael D. Contributor: Czeck, Edward W. Contributor: Doelitzsch, Dennis F. Contributor: Frenzel, James F. Contributor: Giri, Jay C. Contributor: Harbor, Royce D. Contributor: Kolias, Nicholas J. Contributor: Kosbar, Kurt L. Contributor: Kurumbalapitiya, Dhammika, Contributor: Lall, Pradeep, Contributor: Lasky, Ty A. Contributor: McInroy, John E. Contributor: Pu, Yuan, Contributor: Sherr, Solomon, Contributor: Shim, Theodore I. Contributor: Smith, L. Montgomery, Contributor: Sworder, David D. Contributor: Thomas, Joy A. Contributor: Tragoudas, Spyros, Contributor: Vranesic, Zvonko G. Contributor: Wan, Zhen, Contributor: Whitehead, Donald G. Contributor: Looney, Carl G. Contributor: Cover, Thomas, Contributor: Hinton, Harvard S. Contributor: Moss, Gregory L. Contributor: Etter, Delores M. Contributor: Pecht, Michael, Contributor: Sankaran, C. Contributor: Cogdell, J.R. Contributor: Irwin, J. David, Contributor: Chan, Shu-Park, Contributor: Angelopoulos C.E.T., Nick, Contributor: Balabanian, Norman, Contributor: Kerwin, William J. Contributor: Hudgins, Jerry L. Contributor: Mayaram, Kartikeya, Contributor: Gibson, Jerry D. Contributor: Bogart, Theodore F. Contributor: Johnson, David E. Contributor: Ephraim, Yariv, Contributor: Pillai, S. Unnikrishna, Contributor: Bose, Bimal K. Contributor: Chassaing, Rulph, Contributor: Milkovic, Miram, Contributor: Kazakos, Demetrios, Contributor: Rajala, Sara, Contributor: Parhi, Keshab K. Contributor: Schroeter, Juergen, Contributor: Stephenson, F. William, Contributor: Elshabini, Aicha, Contributor: Parks, Harold G. Contributor: Brews, John, Contributor: Choma Jr., John, Contributor: Needham, Wayne, Contributor: Rajaram, S. Contributor: Zargham, Mehdi R. Contributor: Kennedy, Eldredge J. Contributor: Carpenter, Gordon L. Contributor: Rajashekara, Kaushik S. Contributor: Watkins, Laurence S. Contributor: Steadman, John W. Contributor: Bhat, Ashoka K.S. Contributor: Hecht, Jeff, Contributor: Becker, Richard A. Contributor: Bate, Geoffrey, Contributor: Fitch, J. Patrick, Contributor: Trew, Robert, Contributor: Agbo, Samuel O. Contributor: Bahl, Inder J. Contributor: Compton, Richard C. Contributor: Steer, Michael, Contributor: Wiltse, James C. Contributor: Messenger, Roger, Contributor: Ventre, Jerry, Contributor: Vai, M. Michael, Contributor: Sherif, Mostafa Hashem, Contributor: Lyshevski, Sergey Edward, Contributor: Llinas, James, Contributor: Feng, Tse-yun, Contributor: Szidarovszky, Ferenc, Contributor: Chen, Wai-Kai, Contributor: Etzold, Karl F. Contributor: Ehrlich, Alexander, Contributor: Boldea, Ion, Contributor: Jorgensen, Paul C. Contributor: Willner, Alan E. Contributor: Kurfess, Thomas R. Contributor: Finkel, Raphael A. Contributor: Phillips, Charles, Contributor: Khalilieh, Sam S. Contributor: Shi, Yun Q. Contributor: Ozbay, Hitay, Contributor: Attia, John Okyere, Contributor: Hall, David L. Contributor: Tuzlukov, Vyacheslav, Contributor: Strauss, Alvin M. Contributor: Relf, Christopher G. Contributor: Ives, Robert W. Contributor: Salkintzis, Apostolis K. Contributor: Ibnkahla, Mohamed, Contributor: Piper, Samuel O. Contributor: Hansson, Hans, Contributor: Enslin, Johan H. R. Contributor: Chellappa, Rama, Contributor: Crawford, Reginald, Contributor: Delapp, David R. Contributor: Du, Yingzi, Contributor: Kim, Yong Deak, Contributor: Robertson, Ian D. Contributor: Tayahi, Moncef Benjamin, Contributor: Wright, Cameron H.G. Contributor: Yoon, Won-Sik, Contributor: Xiong, Ping, Contributor: Musa, Sarhan, Contributor: Qian, Haoli, Contributor: Serban, Ioan, Contributor: White, John A. Contributor: Lee, Young Choon, Contributor: Maharatna, Koushik, Contributor: Hobbs, Bryan, Contributor: Kryder, Mark H. Contributor: Tallarida, Ronald J. Contributor: Uman, Martin A. Contributor: Paul, Clayton R. Contributor: Sadiku, Matthew N.O. Contributor: Bahill, A. Terry, Contributor: Wilcox, Lynn D. Contributor: Bose, N.K. Contributor: Oldfield, John Victor, Contributor: Rawat, Banmali S. Contributor: Shaw, Leonard G. Contributor: Poularikas, Alexander D. Series Editor: Dorf, Richard C. CRC Press, Hardcover, Auflage: 3, 3672 Seiten, Publiziert: 2006-01-20T00:00:01Z, Produktgruppe: Book, 6.95 kg, Verkaufsrang: 3302981, Books Global Store, Special Features, Books, Computing & Internet, Subjects, Environmental, Civil Engineering, Engineering & Technology, Science, Nature & Maths, Electrical Engineering, Electronics Engineering, Electronics & Communications Engineering, Energy Technology, Reference, Mathematics, Electromagnetism, Physics, Scientific, Technical & Medical, Environmental Engineering, Format: Illustrated, CRC Press, 2006<