2005, ISBN: 9783540226802
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CCD Image Sensors in Deep-Ultraviolet Degradation Behavior and Damage Mechanisms - gebonden uitgave, pocketboek
2005, ISBN: 354022680X
2005 Gebundene Ausgabe Mikrotechnologie - Mikrotechnik, Technologie / Mikrotechnologie, Sensor - Sensorik, Ingenieurwissenschaft - Ingenieurwissenschaftler, Maschinenbau, Materialwissen… Meer...
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2005, ISBN: 9783540226802
[ED: Hardcover], [PU: Springer / Springer Berlin Heidelberg / Springer, Berlin], As the deep-ultraviolet (DUV) laser technology continues to mature, an increasing number of industrial and… Meer...
2001, ISBN: 9783540226802
[ED: Buch], [PU: Springer-Verlag GmbH], Neuware - As the deep-ultraviolet (DUV) laser technology continues to mature, an increasing number of industrial and manufacturing applications are… Meer...
2001
ISBN: 9783540226802
[ED: Buch], [PU: Springer-Verlag GmbH], Neuware - As the deep-ultraviolet (DUV) laser technology continues to mature, an increasing number of industrial and manufacturing applications are… Meer...
2001, ISBN: 9783540226802
[ED: Buch], [PU: Springer-Verlag GmbH], Neuware - As the deep-ultraviolet (DUV) laser technology continues to mature, an increasing number of industrial and manufacturing applications are… Meer...
CCD Image Sensors in Deep-Ultraviolet Degradation Behavior and Damage Mechanisms - gebonden uitgave, pocketboek
2005, ISBN: 354022680X
2005 Gebundene Ausgabe Mikrotechnologie - Mikrotechnik, Technologie / Mikrotechnologie, Sensor - Sensorik, Ingenieurwissenschaft - Ingenieurwissenschaftler, Maschinenbau, Materialwissen… Meer...
Bibliografische gegevens van het best passende boek
auteur: | |
Titel: | |
ISBN: |
Gedetalleerde informatie over het boek. - CCD Image Sensors in Deep-Ultraviolet: Degradation Behavior and Damage Mechanisms (Microtechnology and MEMS)
EAN (ISBN-13): 9783540226802
ISBN (ISBN-10): 354022680X
Gebonden uitgave
pocket book
Verschijningsjaar: 2002
Uitgever: Springer-Verlag GmbH
Boek bevindt zich in het datenbestand sinds 2007-05-22T11:58:04+02:00 (Amsterdam)
Detailpagina laatst gewijzigd op 2022-08-05T18:33:25+02:00 (Amsterdam)
ISBN/EAN: 354022680X
ISBN - alternatieve schrijfwijzen:
3-540-22680-X, 978-3-540-22680-2
alternatieve schrijfwijzen en verwante zoekwoorden:
Auteur van het boek: flora
Titel van het boek: mems, sensor, flora heidelberg, ccd, into the deep, deep value, damage, degradation, ultraviolet
Gegevens van de uitgever
Auteur: Flora Li; Arokia Nathan
Titel: Microtechnology and MEMS; CCD Image Sensors in Deep-Ultraviolet - Degradation Behavior and Damage Mechanisms
Uitgeverij: Springer; Springer Berlin
232 Bladzijden
Verschijningsjaar: 2005-03-01
Berlin; Heidelberg; DE
Taal: Engels
160,49 € (DE)
164,99 € (AT)
177,00 CHF (CH)
Available
XII, 232 p. 84 illus.
BB; Hardcover, Softcover / Technik/Maschinenbau, Fertigungstechnik; Technische Anwendung von elektronischen, magnetischen, optischen Materialien; Verstehen; Ingenieurwissenschaften; Physik; CCD image sensor; Deep-UV damage mechanisms; Eximer laser; Photodiode; Sensor; UV photodiodes; design; imaging; integrated circuit; laser; optimization; semiconductor; technology; Optical Materials; Laser; Technology and Engineering; Electronics and Microelectronics, Instrumentation; Laserphysik; Ingenieurswesen, Maschinenbau allgemein; Elektronik; EA; BC
Overview of CCD.- CCD Imaging in the Ultraviolet (UV) Regime.- Silicon.- Silicon Dioxide.- Si-SiO2 Interface.- General Effects of Radiation.- Effects of Radiation on CCDs.- UV-Induced Effects in Si.- UV Laser Induced Effects in SiO2.- UV Laser Induced Effects at the Si-SiO2 Interface.- CCD Measurements at 157nm.- Design Optimizations for Future Research.- Concluding Remarks.The first book to integrate CCD image sensor characteristics, their intrinsic instabilities, and the effect of UV radiation on device characteristics
Andere boeken die eventueel grote overeenkomsten met dit boek kunnen hebben:
Laatste soortgelijke boek:
9783642061523 CCD Image Sensors in Deep-Ultraviolet: Degradation Behavior and Damage Mechanisms (Microtechnology and MEMS) (Li, Flora)
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