ISBN: 9780470227220
Written by one of the pioneers of 2D X-Ray Diffraction, this useful guide covers the fundamentals, experimental methods and applications of two-dimensional x-ray diffraction, including ge… Meer...
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ISBN: 9780470227220
Written by one of the pioneers of 2D X-Ray Diffraction, this useful guide covers the fundamentals, experimental methods and applications of two-dimensional x-ray diffraction, including ge… Meer...
2009, ISBN: 0470227222
[EAN: 9780470227220], Gebraucht, guter Zustand, [PU: Wiley], A+ Customer service! Satisfaction Guaranteed! Book is in Used-Good condition. Pages and cover are clean and intact. Used items… Meer...
2009
ISBN: 0470227222
[EAN: 9780470227220], Gebraucht, wie neu, [PU: Wiley], Like new, gift quality condition. Our feedback says it all! Feel confident when you order from Hilltop Book Shop., Books
2009, ISBN: 9780470227220
Hardcover, Access codes and supplements are not guaranteed with used items. May be an ex-library book., Gebraucht, guter Zustand, [PU: Wiley]
2009, ISBN: 0470227222
[EAN: 9780470227220], Gebraucht, wie neu, [PU: Wiley], Like New, Books
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Gedetalleerde informatie over het boek. - Two-dimensional X-ray Diffraction
EAN (ISBN-13): 9780470227220
ISBN (ISBN-10): 0470227222
Gebonden uitgave
Verschijningsjaar: 2009
Uitgever: Wiley
426 Bladzijden
Gewicht: 0,721 kg
Taal: eng/Englisch
Boek bevindt zich in het datenbestand sinds 2009-09-27T13:57:12+02:00 (Amsterdam)
Detailpagina laatst gewijzigd op 2022-06-28T15:40:11+02:00 (Amsterdam)
ISBN/EAN: 9780470227220
ISBN - alternatieve schrijfwijzen:
0-470-22722-2, 978-0-470-22722-0
alternatieve schrijfwijzen en verwante zoekwoorden:
Titel van het boek: ray
Gegevens van de uitgever
Auteur: B. B. He
Titel: Two-dimensional X-ray Diffraction
Uitgeverij: John Wiley & Sons
426 Bladzijden
Verschijningsjaar: 2009-09-04
Gewicht: 0,710 kg
Taal: Engels
165,00 € (DE)
No longer receiving updates
164mm x 239mm x 24mm
BB; Hardcover, Softcover / Chemie; Analytische Chemie; Analytical Chemistry; Analytische Chemie; Chemie; Chemistry; Materials Science; Materialwissenschaften; Pharmaceutical & Medicinal Chemistry; Pharmazeutische u. Medizinische Chemie; Röntgenbeugung; Analytische Chemie; Pharmazeutische u. Medizinische Chemie; Allg. Materialwissenschaften
Preface. 1. Introduction. 1.1 X-Ray Technology and Its Brief History. 1.2 Geometry of Crystals. 1.3 Principles of X-Ray Diffraction. 1.4 Reciprocal Space and Diffraction. 1.5 Two-Dimensional X-Ray Diffraction. 2. Geometry Conventions. 2.1 Introduction. 2.2 Diffraction Space and Laboratory Coordinates. 2.3 Detector Space and Detector Geometry. 2.4 Sample Space and Goniometer Geometry. 2.5 Transformation from Diffraction Space to Sample Space. 2.6 Summary of XRD2 Geometry. References. 3. X-Ray Source and Optics. 3.1 X-Ray Generation and Characteristics. 3.2 X-Ray Optics. References. 4. X-Ray Detectors. 4.1 History of X-Ray Detection Technology. 4.2 Point Detectors in Conventional Diffractometers. 4.3 Characteristics of Point Detectors. 4.4 Line Detectors. 4.5 Characteristics of Area Detectors. 4.6 Types of Area Detectors. 5. Goniometer and Sample Stages. 5.1 Goniometer and Sample Position. 5.2 Goniometer Accuracy. 5.3 Sample Alignment and Visualization Systems. 5.4 Environment Stages. References. 6. Data Treatment. 6.1 Introduction. 6.2 Nonuniform Response Correction. 6.3 Spatial Correction. 6.4 Detector Position Accuracy and Calibration. 6.5 Frame Integration. 6.6 Lorentz, Polarization, and Absorption Corrections. 7. Phase Identification. 7.1 Introduction. 7.2 Relative Intensity. 7.3 Geometry and Resolution. 7.4 Sampling Statistics. 7.5 Preferred Orientation Effect. References. 8. Texture Analysis. 8.1 Introduction. 8.2 Pole Density and Pole Figure. 8.3 Fundamental Equations. 8.4 Data Collection Strategy. 8.5 Texture Data Process. 8.6 Orientation Distribution Function. 8.7 Fiber Texture. 8.8 Other Advantages of XRD2 for Texture. References. 9. Stress Measurement. 9.1 Introduction. 9.2 Principle of X-Ray Stress Analysis. 9.3 Theory of Stress Analysis with XRD2. 9.4 Process of Stress Measurement with XRD2. 9.5 Experimental Examples. Appendix 9.A Calculation of Principal Stresses from the General Stress Tensor. Appendix 9.B Parameters for Stress Measurement. References. 10. Small-Angle X-Ray Scattering. 10.1 Introduction. 10.2 2D SAXS Systems. 10.3 Application Examples. 10.4 Some Innovations in 2D SAXS. References. 11. Combinatorial Screening. 11.1 Introduction. 11.2 XRD2 Systems for Combinatorial Screening. 11.3 Combined Screening with XRD2 and Raman. 12. Quantitative Analysis. 12.1 Percent Crystallinity. 12.2 Crystal Size. 12.3 Retained Austenite. References. 13. Innovation and Future Development. 13.1 Introduction. 13.2 Scanning Line Detector for XRD2. 13.3 Three-Dimensional Detector. 13.4 Pixel Direct Diffraction Analysis. References. Appendix A. Values of Commonly Used Parameters. Appendix B. Symbols. Index.Andere boeken die eventueel grote overeenkomsten met dit boek kunnen hebben:
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