Auger- and X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide (Springer Series in Surface Sciences, 49, Band 49) - gebonden uitgave, pocketboek
2012, ISBN: 9783642273803
Springer, Gebundene Ausgabe, Auflage: 2013, 548 Seiten, Publiziert: 2012-10-25T00:00:01Z, Produktgruppe: Buch, Hersteller-Nr.: biography, 20.72 kg, Maschinenbau, Ingenieurwissenschaften, … Meer...
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Auger- And X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide - gebonden uitgave, pocketboek
2012, ISBN: 9783642273803
Hard cover, New., Sewn binding. Cloth over boards. 528 p. Contains: Unspecified. Springer Surface Sciences, 49., Berlin, Heidelberg, [PU: Springer]
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Auger- and X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide (Springer Series in Surface Sciences, 49) - gebonden uitgave, pocketboek
2012, ISBN: 3642273807
[EAN: 9783642273803], Neubuch, [PU: Springer], Clean and crisp and new!, Books
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Auger- and X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide - gebonden uitgave, pocketboek
2012, ISBN: 3642273807
[EAN: 9783642273803], Gebraucht, wie neu, [PU: Springer 2012-10-25], Item is in new condition., Books
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Auger- and X-ray Photoelectron Spectroscopy in Materials Science: A User-oriented Guide - gebonden uitgave, pocketboek
2013, ISBN: 9783642273803
Springer Verlag, 2012. Hardcover. New. 2013 edition. 547 pages. 9.25x6.00x1.00 inches., Springer Verlag, 2012, 6
Biblio.co.uk |
Auger- and X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide (Springer Series in Surface Sciences, 49, Band 49) - gebonden uitgave, pocketboek
2012, ISBN: 9783642273803
Springer, Gebundene Ausgabe, Auflage: 2013, 548 Seiten, Publiziert: 2012-10-25T00:00:01Z, Produktgruppe: Buch, Hersteller-Nr.: biography, 20.72 kg, Maschinenbau, Ingenieurwissenschaften, … Meer...
Hofmann, Siegfried:
Auger- And X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide - gebonden uitgave, pocketboek2012, ISBN: 9783642273803
Hard cover, New., Sewn binding. Cloth over boards. 528 p. Contains: Unspecified. Springer Surface Sciences, 49., Berlin, Heidelberg, [PU: Springer]
Auger- and X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide (Springer Series in Surface Sciences, 49) - gebonden uitgave, pocketboek
2012
ISBN: 3642273807
[EAN: 9783642273803], Neubuch, [PU: Springer], Clean and crisp and new!, Books
Auger- and X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide - gebonden uitgave, pocketboek
2012, ISBN: 3642273807
[EAN: 9783642273803], Gebraucht, wie neu, [PU: Springer 2012-10-25], Item is in new condition., Books
Auger- and X-ray Photoelectron Spectroscopy in Materials Science: A User-oriented Guide - gebonden uitgave, pocketboek
2013, ISBN: 9783642273803
Springer Verlag, 2012. Hardcover. New. 2013 edition. 547 pages. 9.25x6.00x1.00 inches., Springer Verlag, 2012, 6
Bibliografische gegevens van het best passende boek
auteur: | |
Titel: | |
ISBN: |
To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.
Gedetalleerde informatie over het boek. - Auger- and X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide (Springer Series in Surface Sciences, 49, Band 49)
EAN (ISBN-13): 9783642273803
ISBN (ISBN-10): 3642273807
Gebonden uitgave
Verschijningsjaar: 2012
Uitgever: Springer
528 Bladzijden
Gewicht: 0,939 kg
Taal: Englisch
Boek bevindt zich in het datenbestand sinds 2007-06-19T21:28:18+02:00 (Amsterdam)
Detailpagina laatst gewijzigd op 2023-08-09T18:04:24+02:00 (Amsterdam)
ISBN/EAN: 9783642273803
ISBN - alternatieve schrijfwijzen:
3-642-27380-7, 978-3-642-27380-3
alternatieve schrijfwijzen en verwante zoekwoorden:
Auteur van het boek: hofman, siegfried hofmann, hofmann else, siegfried springer
Titel van het boek: before science, material sciences, materials sciences, surface science series, user guide, ray spectroscopy
Gegevens van de uitgever
Auteur: Siegfried Hofmann
Titel: Springer Series in Surface Sciences; Auger- and X-Ray Photoelectron Spectroscopy in Materials Science - A User-Oriented Guide
Uitgeverij: Springer; Springer Berlin
528 Bladzijden
Verschijningsjaar: 2012-10-25
Berlin; Heidelberg; DE
Gedrukt / Gemaakt in
Taal: Engels
320,99 € (DE)
329,99 € (AT)
354,00 CHF (CH)
POD
XX, 528 p.
BB; Hardcover, Softcover / Physik, Astronomie/Atomphysik, Kernphysik; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); Verstehen; Auger electron spectroscopy; interface analysis; scanning Auger microscopy; surface analysis; thin-film depth profiling; Condensed Matter Physics; Spectroscopy; Surfaces, Interfaces and Thin Film; Spektroskopie, Spektrochemie, Massenspektrometrie; Materialwissenschaft; BC
Outline of the Technique/Brief Description.- Theoretical Background.- Instrumentation.- Practical Surface Analysis with AES.- Data Evaluation/Quantification.- Problem Solving with AES (Examples).This is the most comprehensive book available on this widely used analytical technique Includes supplementary material: sn.pub/extras
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