
ISBN: 9789048167852
ISBN-13: 9789048167852, 978-9048167852. This book is a tribute to Professor John P Keeves for the advocacy of the Rasch model in Australia. Format: Paperback. Papers in Honour of John P. … Meer...
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2010, ISBN: 9789048167852
[ED: Softcover], [PU: Springer / Springer Netherlands], While the primary purpose of the book is a celebration of John's contributions to the field of measurement, a second and related pu… Meer...
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2010, ISBN: 904816785X
[EAN: 9789048167852], Neubuch, [SC: 37.04], [PU: Springer Netherlands], INTERPRETATION; MATHEMATICS; RESEARCH; TESTTHEORY, Druck auf Anfrage Neuware - Printed after ordering - While the p… Meer...
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2005, ISBN: 9789048167852
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Springer, 2005. Paperback. New. softcover reprint of hardcover 1st ed. 2005 edition. 376 pages. 9.00x6.00x0.86 inches., Springer, 2005, 6
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2010, ISBN: 9789048167852
Papers in Honour of John P. Keeves, Buch, Softcover, Softcover reprint of hardcover 1st ed. 2005, [PU: Springer], Springer, 2010
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ISBN: 9789048167852
ISBN-13: 9789048167852, 978-9048167852. This book is a tribute to Professor John P Keeves for the advocacy of the Rasch model in Australia. Format: Paperback. Papers in Honour of John P. … Meer...

Herausgegeben:Alagumalai, Sivakumar; Hungi, Njora; Curtis, David D.:
Applied Rasch Measurement: A Book of Exemplars - pocketboek2010, ISBN: 9789048167852
[ED: Softcover], [PU: Springer / Springer Netherlands], While the primary purpose of the book is a celebration of John's contributions to the field of measurement, a second and related pu… Meer...

2010
ISBN: 904816785X
[EAN: 9789048167852], Neubuch, [SC: 37.04], [PU: Springer Netherlands], INTERPRETATION; MATHEMATICS; RESEARCH; TESTTHEORY, Druck auf Anfrage Neuware - Printed after ordering - While the p… Meer...
2005, ISBN: 9789048167852
gebonden uitgave
Springer, 2005. Paperback. New. softcover reprint of hardcover 1st ed. 2005 edition. 376 pages. 9.00x6.00x0.86 inches., Springer, 2005, 6
2010, ISBN: 9789048167852
Papers in Honour of John P. Keeves, Buch, Softcover, Softcover reprint of hardcover 1st ed. 2005, [PU: Springer], Springer, 2010
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Gedetalleerde informatie over het boek. - Applied Rasch Measurement: A Book of Exemplars
EAN (ISBN-13): 9789048167852
ISBN (ISBN-10): 904816785X
Gebonden uitgave
pocket book
Verschijningsjaar: 2010
Uitgever: Springer
380 Bladzijden
Gewicht: 0,604 kg
Taal: eng/Englisch
Boek bevindt zich in het datenbestand sinds 2011-10-01T17:34:52+02:00 (Amsterdam)
Detailpagina laatst gewijzigd op 2023-07-17T20:33:37+02:00 (Amsterdam)
ISBN/EAN: 9789048167852
ISBN - alternatieve schrijfwijzen:
90-481-6785-X, 978-90-481-6785-2
alternatieve schrijfwijzen en verwante zoekwoorden:
Auteur van het boek: curtis david
Titel van het boek: measurement, rasch
Gegevens van de uitgever
Auteur: Sivakumar Alagumalai; David D. Curtis; Njora Hungi
Titel: Education in the Asia-Pacific Region: Issues, Concerns and Prospects; Applied Rasch Measurement: A Book of Exemplars - Papers in Honour of John P. Keeves
Uitgeverij: Springer; Springer Netherland
360 Bladzijden
Verschijningsjaar: 2010-10-28
Dordrecht; NL
Gedrukt / Gemaakt in
Gewicht: 0,606 kg
Taal: Engels
213,99 € (DE)
219,99 € (AT)
236,00 CHF (CH)
POD
XVIII, 360 p.
BC; Education, general; Hardcover, Softcover / Pädagogik; Pädagogik; Verstehen; Interpretation; mathematics; research; test theory; International and Comparative Education; Probability Theory and Stochastic Processes; Education; International and Comparative Education; Probability Theory; Bildungssysteme und -strukturen; Wahrscheinlichkeitsrechnung und Statistik; Stochastik; BB
Preface Part 1 Measurement and the Rasch model Chapter 1 Classical Test Theory; Sivakumar Alagumalai and David Curtis Chapter 2 Objective measurement; Geoff Masters Chapter 3 The Rasch model explained; David Andrich Part 2A Applications of the Rasch Model–Tests and Competencies Chapter 4 Monitoring mathematics achievement over time; Tilahun Mengesha Afrassa Chapter 5 Manual and automatic estimates of growth and gain across year levels: How close is close? Petra Lietz and Dieter Kotte Chapter 6 Japanese language learning and the Rasch model; Kazuyo Taguchi Chapter 7 Chinese language learning and the Rasch model; Ruilan Yuan Chapter 8 Applying the Rasch model to detect biased items; Njora Hungi Chapter 9 Raters and examinations; Steven Barrett Chapter 10 Comparing classical and contemporary analyses and Rasch measurement; David Curtis Chapter 11 Combining Rasch scaling and Multi-level analysis; Murray Thompson Part 2B Applications of the Rasch Model–Attitudes Scales and Views Chapter 12 Rasch and attitude scales: Explanatory Style; Shirley Yates Chapter 13 Science teachers’ views on science, technology and society issues; Debra Tedman Chapter 14 Estimating the complexity of workplace rehabilitation task using Rasch analysis; Ian Blackman Chapter 15 Creating a scale as a general measure of satisfaction for information and communications technology users; I Gusti Ngurah Darmawan Part 3 Extensions of the Rasch Model Chapter 16 Multidimensional item responses: Multimethod-multitrait perspectives; Mark Wilson and Machteld Hoskens Chapter 17 Information functions for the general dichotomous unfolding model; Luo Guanzhong and David Andrich Chapter 18 Past, present and future: an idiosyncratic view of Rasch measurement; TrevorBond Epilogue Our Experiences and Conclusion; Sivakumar Alagumalai, David Curtis and Njora Hungi Appendix IRT Software–Descriptions and Student Versions BIGSTEPS/WINSTEPS CONQUEST RASCAL RUMM RATEFOLD/RUMMFOLD QUEST WINMIRA Subject IndexAndere boeken die eventueel grote overeenkomsten met dit boek kunnen hebben:
Laatste soortgelijke boek:
9781402030727 Applied Rasch Measurement: A Book of Exemplars (S. Alagumalai#D. D. Curtis#N. Hungi)
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