- 0 resultaten
laagste prijs: € 236,51, hoogste prijs: € 267,49, gemiddelde prijs: € 255,84
1
Applied Rasch Measurement: A Book of Exemplars - Sivakumar Alagumalai; David D. Curtis; Njora Hungi
bestellen
bij Springer.com
CHF 267,49
(ongeveer € 236,51)
bestellen
Gesponsorde link
Sivakumar Alagumalai; David D. Curtis; Njora Hungi:

Applied Rasch Measurement: A Book of Exemplars - pocketboek

ISBN: 9789048167852

While the primary purpose of the book is a celebration of John’s contributions to the field of measurement, a second and related purpose is to provide a useful resource. We believe that t… Meer...

  - new in stock CH:::0.00 EUR. Verzendingskosten:zzgl. Versandkosten., exclusief verzendingskosten
2
Applied Rasch Measurement: A Book of Exemplars: Papers in Honour of John P. Keeves (Education in the Asia-Pacific Region: Issues, Concerns and Prospects, Band 4)
bestellen
bij Amazon.de (Intern. Bücher)
€ 240,23
verzending: € 0,00
bestellen
Gesponsorde link
Applied Rasch Measurement: A Book of Exemplars: Papers in Honour of John P. Keeves (Education in the Asia-Pacific Region: Issues, Concerns and Prospects, Band 4) - pocketboek

2010, ISBN: 9789048167852

Springer, Taschenbuch, Auflage: Softcover reprint of hardcover 1st ed. 2005, 380 Seiten, Publiziert: 2010-10-28T00:00:01Z, Produktgruppe: Book, 1.34 kg, Recht, Kategorien, Bücher, Soziolo… Meer...

Verzendingskosten:Auf Lager. Lieferung von Amazon. (EUR 0.00) Amazon.de
3
Applied Rasch Measurement: A Book of Exemplars: Papers in Honour of John P. Keeves (Education in the Asia-Pacific Region: Issues, Concerns and Prospects, Band 4)
bestellen
bij Amazon.de (Intern. Bücher)
€ 267,49
verzending: € 0,00
bestellen
Gesponsorde link
Applied Rasch Measurement: A Book of Exemplars: Papers in Honour of John P. Keeves (Education in the Asia-Pacific Region: Issues, Concerns and Prospects, Band 4) - pocketboek

2010

ISBN: 9789048167852

Springer, Taschenbuch, Auflage: Softcover reprint of hardcover 1st ed. 2005, 380 Seiten, Publiziert: 2010-10-28T00:00:01Z, Produktgruppe: Buch, 1.34 kg, Sozialwissenschaft, Kategorien, Bü… Meer...

Verzendingskosten:Auf Lager. Lieferung von Amazon. (EUR 0.00) Amazon.de
4
Applied Rasch Measurement: A Book of Exemplars - Sivakumar Alagumalai
bestellen
bij BookDepository.com
€ 267,49
verzending: € 0,00
bestellen
Gesponsorde link
Sivakumar Alagumalai:
Applied Rasch Measurement: A Book of Exemplars - pocketboek

ISBN: 9789048167852

Paperback, [PU: Springer], This book attempts to describe the underlying axioms of test theory, and, in particular, the concepts of objective measurement and the Rasch model, and then lin… Meer...

Verzendingskosten:Versandkostenfrei. (EUR 0.00)
5
Applied Rasch Measurement: A Book of Exemplars - Sivakumar Alagumalai
bestellen
bij BookDepository.com
€ 267,49
verzending: € 0,00
bestellen
Gesponsorde link
Sivakumar Alagumalai:
Applied Rasch Measurement: A Book of Exemplars - pocketboek

ISBN: 9789048167852

Paperback, [PU: Springer], This book attempts to describe the underlying axioms of test theory, and, in particular, the concepts of objective measurement and the Rasch model, and then lin… Meer...

Verzendingskosten:Versandkostenfrei. (EUR 0.00)

Bijzonderheden over het boek
Applied Rasch Measurement: A Book of Exemplars: Papers in Honour of John P. Keeves (Education in the Asia-Pacific Region: Issues, Concerns and Prospects, Band 4)

This volume presents applications of the Rasch method to the real world measurement problems encountered by graduate students and other researchers. It includes an introductory section written by leaders and pioneers in the field in which the theory of the model is outlined succinctly. The major part of the book is devoted to research problems that have been addressed by a variety of applications of the Rasch measurement model using commonly available Rasch analysis programs. These examples will provide models and guidance for both researchers and students who are learning to apply the Rasch method. Each chapter outlines the research problem, describes the data used in the analysis, and presents the results of the analyses along with their interpretation. Data sets, command files and output files are available from a website for students and researchers who wish to work through any example in detail. The volume concludes with an exploration of some important extensions of the model to more complex research problems and data structures. Information about the common Rasch analysis programs is presented by their developers along with URLs for locations from which trial/demo/student versions of these programs can be downloaded.

Gedetalleerde informatie over het boek. - Applied Rasch Measurement: A Book of Exemplars: Papers in Honour of John P. Keeves (Education in the Asia-Pacific Region: Issues, Concerns and Prospects, Band 4)


EAN (ISBN-13): 9789048167852
ISBN (ISBN-10): 904816785X
Gebonden uitgave
pocket book
Verschijningsjaar: 2010
Uitgever: Alagumalai, Sivakumar, Curtis, David D. Hungi, Njora, Springer
380 Bladzijden
Gewicht: 0,604 kg
Taal: eng/Englisch

Boek bevindt zich in het datenbestand sinds 2011-10-01T17:34:52+02:00 (Amsterdam)
Detailpagina laatst gewijzigd op 2021-04-26T06:45:37+02:00 (Amsterdam)
ISBN/EAN: 9789048167852

ISBN - alternatieve schrijfwijzen:
90-481-6785-X, 978-90-481-6785-2


Gegevens van de uitgever

Auteur: Sivakumar Alagumalai; David D. Curtis; Njora Hungi
Titel: Education in the Asia-Pacific Region: Issues, Concerns and Prospects; Applied Rasch Measurement: A Book of Exemplars - Papers in Honour of John P. Keeves
Uitgeverij: Springer; Springer Netherland
360 Bladzijden
Verschijningsjaar: 2010-10-28
Dordrecht; NL
Gedrukt / Gemaakt in
Gewicht: 0,606 kg
Taal: Engels
267,49 € (DE)
274,99 € (AT)
295,00 CHF (CH)
POD

BC; Previously published in hardcover; Hardcover, Softcover / Pädagogik; Pädagogik; Verstehen; Interpretation; mathematics; research; test theory; B; Education, general; International and Comparative Education; Probability Theory and Stochastic Processes; Education; International and Comparative Education; Probability Theory; Education; Pädagogik; Wahrscheinlichkeitsrechnung und Statistik; Stochastik; BB

Preface Part 1 Measurement and the Rasch model Chapter 1 Classical Test Theory; Sivakumar Alagumalai and David Curtis Chapter 2 Objective measurement; Geoff Masters Chapter 3 The Rasch model explained; David Andrich Part 2A Applications of the Rasch Model–Tests and Competencies Chapter 4 Monitoring mathematics achievement over time; Tilahun Mengesha Afrassa Chapter 5 Manual and automatic estimates of growth and gain across year levels: How close is close? Petra Lietz and Dieter Kotte Chapter 6 Japanese language learning and the Rasch model; Kazuyo Taguchi Chapter 7 Chinese language learning and the Rasch model; Ruilan Yuan Chapter 8 Applying the Rasch model to detect biased items; Njora Hungi Chapter 9 Raters and examinations; Steven Barrett Chapter 10 Comparing classical and contemporary analyses and Rasch measurement; David Curtis Chapter 11 Combining Rasch scaling and Multi-level analysis; Murray Thompson Part 2B Applications of the Rasch Model–Attitudes Scales and Views Chapter 12 Rasch and attitude scales: Explanatory Style; Shirley Yates Chapter 13 Science teachers’ views on science, technology and society issues; Debra Tedman Chapter 14 Estimating the complexity of workplace rehabilitation task using Rasch analysis; Ian Blackman Chapter 15 Creating a scale as a general measure of satisfaction for information and communications technology users; I Gusti Ngurah Darmawan Part 3 Extensions of the Rasch Model Chapter 16 Multidimensional item responses: Multimethod-multitrait perspectives; Mark Wilson and Machteld Hoskens Chapter 17 Information functions for the general dichotomous unfolding model; Luo Guanzhong and David Andrich Chapter 18 Past, present and future: an idiosyncratic view of Rasch measurement; TrevorBond Epilogue Our Experiences and Conclusion; Sivakumar Alagumalai, David Curtis and Njora Hungi Appendix IRT Software–Descriptions and Student Versions BIGSTEPS/WINSTEPS CONQUEST RASCAL RUMM RATEFOLD/RUMMFOLD QUEST WINMIRA Subject Index

Andere boeken die eventueel grote overeenkomsten met dit boek kunnen hebben:

Laatste soortgelijke boek:
9789048101757 Applied Rasch Measurement: A Book of Exemplars


< naar Archief...