2010, ISBN: 9789048173037
[ED: Softcover], [PU: Springer Netherlands], This book walks the reader through all the aspects of manufacturability and yield in a nano-CMOS process. It covers all CAD/CAE aspects of a S… Meer...
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2010, ISBN: 9048173035
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Design for Manufacturability and Yield for Nano-Scale CMOS / Jamil Kawa (u. a.) / Taschenbuch / Integrated Circuits and Systems / Paperback / XXVII / Englisch / 2010 / Springer Netherland - pocketboek
2010, ISBN: 9789048173037
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[ED: Taschenbuch], [PU: Springer Netherland], This book walks the reader through all the aspects of manufacturability and yield in a nano-CMOS process. It covers all CAD/CAE aspects of a … Meer...
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Design for Manufacturability and Yield for Nano-Scale CMOS (Integrated Circuits and Systems) - pocketboek
2010, ISBN: 9789048173037
Mitwirkende: Kawa, Jamil, Springer, Taschenbuch, Auflage: Softcover reprint of hardcover 1st ed. 2007, 288 Seiten, Publiziert: 2010-11-22T00:00:01Z, Produktgruppe: Buch, Hersteller-Nr.: b… Meer...
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2010, ISBN: 9789048173037
[ED: Softcover], [PU: Springer Netherlands], This book walks the reader through all the aspects of manufacturability and yield in a nano-CMOS process. It covers all CAD/CAE aspects of a S… Meer...
2010, ISBN: 9048173035
[EAN: 9789048173037], Neubuch, [SC: 0.0], [PU: Springer Netherlands], Druck auf Anfrage Neuware - This book walks the reader through all the aspects of manufacturability and yield in a na… Meer...
2010
ISBN: 9048173035
[EAN: 9789048173037], Neubuch, [PU: Springer Netherlands], Druck auf Anfrage Neuware - This book walks the reader through all the aspects of manufacturability and yield in a nano-CMOS pro… Meer...
Design for Manufacturability and Yield for Nano-Scale CMOS / Jamil Kawa (u. a.) / Taschenbuch / Integrated Circuits and Systems / Paperback / XXVII / Englisch / 2010 / Springer Netherland - pocketboek
2010, ISBN: 9789048173037
gebonden uitgave
[ED: Taschenbuch], [PU: Springer Netherland], This book walks the reader through all the aspects of manufacturability and yield in a nano-CMOS process. It covers all CAD/CAE aspects of a … Meer...
Design for Manufacturability and Yield for Nano-Scale CMOS (Integrated Circuits and Systems) - pocketboek
2010, ISBN: 9789048173037
Mitwirkende: Kawa, Jamil, Springer, Taschenbuch, Auflage: Softcover reprint of hardcover 1st ed. 2007, 288 Seiten, Publiziert: 2010-11-22T00:00:01Z, Produktgruppe: Buch, Hersteller-Nr.: b… Meer...
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Gedetalleerde informatie over het boek. - Design for Manufacturability and Yield for Nano-Scale CMOS (Integrated Circuits and Systems)
EAN (ISBN-13): 9789048173037
ISBN (ISBN-10): 9048173035
Gebonden uitgave
pocket book
Verschijningsjaar: 2010
Uitgever: Springer
288 Bladzijden
Gewicht: 0,439 kg
Taal: eng/Englisch
Boek bevindt zich in het datenbestand sinds 2011-05-22T21:08:02+02:00 (Amsterdam)
Detailpagina laatst gewijzigd op 2024-04-02T16:42:18+02:00 (Amsterdam)
ISBN/EAN: 9789048173037
ISBN - alternatieve schrijfwijzen:
90-481-7303-5, 978-90-481-7303-7
alternatieve schrijfwijzen en verwante zoekwoorden:
Auteur van het boek: chiang
Titel van het boek: cmos design, nano, integrated circuits, cmos taschenbuch
Gegevens van de uitgever
Auteur: Charles Chiang; Jamil Kawa
Titel: Integrated Circuits and Systems; Design for Manufacturability and Yield for Nano-Scale CMOS
Uitgeverij: Springer; Springer Netherland
255 Bladzijden
Verschijningsjaar: 2010-11-22
Dordrecht; NL
Gedrukt / Gemaakt in
Taal: Engels
106,99 € (DE)
109,99 € (AT)
118,00 CHF (CH)
POD
XXVII, 255 p.
BC; Hardcover, Softcover / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Schaltkreise und Komponenten (Bauteile); Verstehen; CAD (Computer aided design); CAE (Computer aided engineering); CMOS; Standard; classification; computer-aided design (CAD); computer-aided engineering (CAE); design; development; integrated circuit; layout; model; nano-scale; simulation; tables; Electronic Circuits and Systems; Electronics and Microelectronics, Instrumentation; Computer-Aided Engineering (CAD, CAE) and Design; Processor Architectures; Software Engineering; Nanotechnology; Elektronik; Computer-Aided Design (CAD); Rechnerarchitektur und Logik-Entwurf; Software Engineering; Nanotechnologie; BB
Random Defects.- Systematic Yield - Lithography.- Systematic Yield - Chemical Mechanical Polishing (CMP).- Variability & Parametric Yield.- Design for Yield.- Yield Prediction.- Conclusions.Addressing a new topic (DFM/DFY) critical at 90 nm and beyond No book available today with comprehensive coverage of this topic Book covers all CAD/CAE aspects of a SOC design flow
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