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laagste prijs: € 95,35, hoogste prijs: € 149,99, gemiddelde prijs: € 116,10
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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies - Pavlov, Andrei Sachdev, Manoj
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Pavlov, Andrei Sachdev, Manoj:

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies - pocketboek

2010, ISBN: 9789048178551

[ED: Softcover], [PU: Springer Netherlands], As technology scales into nano-meter region, design and test of Static Random Access Memories (SRAMs) becomes a highly complex task. Process d… Meer...

Verzendingskosten:Versandkostenfrei, Versand nach Deutschland. (EUR 0.00) buecher.de GmbH & Co. KG
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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies - Pavlov, Andrei Sachdev, Manoj
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Pavlov, Andrei Sachdev, Manoj:

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies - pocketboek

2010, ISBN: 9789048178551

[ED: Softcover], [PU: Springer Netherlands], As technology scales into nano-meter region, design and test of Static Random Access Memories (SRAMs) becomes a highly complex task. Process d… Meer...

Verzendingskosten:Versandkostenfrei, Versand nach Deutschland. (EUR 0.00) buecher.de GmbH & Co. KG
3
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies - Pavlov, Andrei Sachdev, Manoj
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€ 111,16
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Pavlov, Andrei Sachdev, Manoj:
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies - pocketboek

2010

ISBN: 9789048178551

[ED: Softcover], [PU: Springer Netherlands], As technology scales into nano-meter region, design and test of Static Random Access Memories (SRAMs) becomes a highly complex task. Process d… Meer...

Verzendingskosten:Zzgl. Versandkosten., exclusief verzendingskosten buecher.de GmbH & Co. KG
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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies - Andrei Pavlov
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Andrei Pavlov:
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies - pocketboek

ISBN: 9789048178551

Paperback, [PU: Springer], The monograph will be dedicated to SRAM (memory) design and test issues in nano-scaled technologies by adapting the cell design and chip design considerations t… Meer...

Verzendingskosten:Versandkostenfrei. (EUR 0.00)
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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies - pocketboek

2008, ISBN: 904817855X

gebonden uitgave

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies ab 149.99 EURO Process-Aware SRAM Design and Test. Softcover reprint of hardcover 1st ed. 2008 Medien > Bücher

Nr. 14051174. Verzendingskosten:, , DE. (EUR 0.00)

Bijzonderheden over het boek
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

The monograph will be dedicated to SRAM (memory) design and test issues in nano-scaled technologies by adapting the cell design and chip design considerations to the growing process variations with associated test issues. Purpose: provide process-aware solutions for SRAM design and test challenges.

Gedetalleerde informatie over het boek. - CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies


EAN (ISBN-13): 9789048178551
ISBN (ISBN-10): 904817855X
Gebonden uitgave
pocket book
Verschijningsjaar: 2010
Uitgever: Springer-Verlag GmbH
212 Bladzijden
Gewicht: 0,328 kg
Taal: eng/Englisch

Boek bevindt zich in het datenbestand sinds 2011-05-06T21:52:55+02:00 (Amsterdam)
Detailpagina laatst gewijzigd op 2020-08-20T17:37:38+02:00 (Amsterdam)
ISBN/EAN: 9789048178551

ISBN - alternatieve schrijfwijzen:
90-481-7855-X, 978-90-481-7855-1


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