CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test - nieuw boek
2010, ISBN: 9789048178551
Kartoniert, 212 Seiten, 235mm x 155mm x 12mm, Sprache(n): eng Gives a process-aware perspective on SRAM circuit design and test Provides detailed coverage of SRAM cell stability, stabilit… Meer...
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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies / Process-Aware SRAM Design and Test / Manoj Sachdev (u. a.) / Taschenbuch / Frontiers in Electronic Testing / Paperback / xvi - pocketboek
2010, ISBN: 9789048178551
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[ED: Taschenbuch], [PU: Springer Netherland], CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From… Meer...
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2008, ISBN: 9789048178551
*CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies* - Process-Aware SRAM Design and Test. Softcover reprint of hardcover 1st ed. 2008 / Taschenbuch für 160.49 € / A… Meer...
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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test - pocketboek
2010, ISBN: 904817855X
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Softcover reprint of hardcover 1st ed. 2008 Kartoniert / Broschiert Computerhardware, Transistor; integrated circuit; static-induction transistor; DOM; RAM, mit Schutzumschlag 11, [PU:S… Meer...
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ISBN: 9789048178551
Standard functional tests often fail to detect unstable SRAM cells. Undetected unstable cells deteriorate quality and reliability of the product as such cells may fail to retain the data … Meer...
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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test - nieuw boek
2010, ISBN: 9789048178551
Kartoniert, 212 Seiten, 235mm x 155mm x 12mm, Sprache(n): eng Gives a process-aware perspective on SRAM circuit design and test Provides detailed coverage of SRAM cell stability, stabilit… Meer...
Sachdev, Manoj:
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies / Process-Aware SRAM Design and Test / Manoj Sachdev (u. a.) / Taschenbuch / Frontiers in Electronic Testing / Paperback / xvi - pocketboek2010, ISBN: 9789048178551
gebonden uitgave
[ED: Taschenbuch], [PU: Springer Netherland], CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From… Meer...
2008
ISBN: 9789048178551
*CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies* - Process-Aware SRAM Design and Test. Softcover reprint of hardcover 1st ed. 2008 / Taschenbuch für 160.49 € / A… Meer...
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test - pocketboek
2010, ISBN: 904817855X
gebonden uitgave
Softcover reprint of hardcover 1st ed. 2008 Kartoniert / Broschiert Computerhardware, Transistor; integrated circuit; static-induction transistor; DOM; RAM, mit Schutzumschlag 11, [PU:S… Meer...
ISBN: 9789048178551
Standard functional tests often fail to detect unstable SRAM cells. Undetected unstable cells deteriorate quality and reliability of the product as such cells may fail to retain the data … Meer...
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ISBN: |
Gedetalleerde informatie over het boek. - CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
EAN (ISBN-13): 9789048178551
ISBN (ISBN-10): 904817855X
Gebonden uitgave
pocket book
Verschijningsjaar: 2010
Uitgever: Springer Netherlands
212 Bladzijden
Gewicht: 0,328 kg
Taal: eng/Englisch
Boek bevindt zich in het datenbestand sinds 2011-05-06T21:52:55+02:00 (Amsterdam)
Detailpagina laatst gewijzigd op 2024-04-02T16:42:16+02:00 (Amsterdam)
ISBN/EAN: 9789048178551
ISBN - alternatieve schrijfwijzen:
90-481-7855-X, 978-90-481-7855-1
alternatieve schrijfwijzen en verwante zoekwoorden:
Auteur van het boek: pavlov
Titel van het boek: cmos design, nano, cmos technologie, best test design, around the circuit, sram, process design, cmos taschenbuch
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