
ISBN: 9789048178766
Book Details Title: New Methods of Concurrent Checking Item Condition: New… Meer...
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2010, ISBN: 9048178762
[EAN: 9789048178766], Neubuch, [SC: 0.0], [PU: Springer Netherlands], CMOS; COMPUTER; CONCURRENTCHECKING; RELIABILITYFORNANOTECHNOLOGIES; SELF-CHECKINGADDERS; SELF-CHECKINGCIRCUITS; SOFTE… Meer...
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New Methods of Concurrent Checking / Michael Gössel (u. a.) / Taschenbuch / Frontiers in Electronic Testing / Paperback / viii / Englisch / 2010 / Springer Netherland / EAN 9789048178766 - pocketboek
2010, ISBN: 9789048178766
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[ED: Taschenbuch], [PU: Springer Netherland], Computers are everywhere around us. We, for example, as air passengers, car drivers, laptop users with Internet connection, cell phone owners… Meer...
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2010, ISBN: 9789048178766
Mitwirkende: Ocheretny, Vitaly, Mitwirkende: Sogomonyan, Egor, Mitwirkende: Marienfeld, Daniel, Springer, Taschenbuch, Auflage: Softcover reprint of hardcover 1st ed. 2008, 192 Seiten, Pu… Meer...
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2010, ISBN: 9789048178766
Springer, Paperback, Auflage: Softcover reprint of hardcover 1st ed. 2008, 190 Seiten, Publiziert: 2010-10-28T00:00:01Z, Produktgruppe: Book, Hersteller-Nr.: Refer to Sapnet. 0.28 kg, Arc… Meer...
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ISBN: 9789048178766
Book Details Title: New Methods of Concurrent Checking Item Condition: New… Meer...

2010, ISBN: 9048178762
[EAN: 9789048178766], Neubuch, [SC: 0.0], [PU: Springer Netherlands], CMOS; COMPUTER; CONCURRENTCHECKING; RELIABILITYFORNANOTECHNOLOGIES; SELF-CHECKINGADDERS; SELF-CHECKINGCIRCUITS; SOFTE… Meer...
New Methods of Concurrent Checking / Michael Gössel (u. a.) / Taschenbuch / Frontiers in Electronic Testing / Paperback / viii / Englisch / 2010 / Springer Netherland / EAN 9789048178766 - pocketboek
2010
ISBN: 9789048178766
gebonden uitgave
[ED: Taschenbuch], [PU: Springer Netherland], Computers are everywhere around us. We, for example, as air passengers, car drivers, laptop users with Internet connection, cell phone owners… Meer...

2010, ISBN: 9789048178766
Mitwirkende: Ocheretny, Vitaly, Mitwirkende: Sogomonyan, Egor, Mitwirkende: Marienfeld, Daniel, Springer, Taschenbuch, Auflage: Softcover reprint of hardcover 1st ed. 2008, 192 Seiten, Pu… Meer...

2010, ISBN: 9789048178766
Springer, Paperback, Auflage: Softcover reprint of hardcover 1st ed. 2008, 190 Seiten, Publiziert: 2010-10-28T00:00:01Z, Produktgruppe: Book, Hersteller-Nr.: Refer to Sapnet. 0.28 kg, Arc… Meer...
Bibliografische gegevens van het best passende boek
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Gedetalleerde informatie over het boek. - New Methods of Concurrent Checking: 42 (Frontiers in Electronic Testing, 42)
EAN (ISBN-13): 9789048178766
ISBN (ISBN-10): 9048178762
Gebonden uitgave
pocket book
Verschijningsjaar: 2010
Uitgever: Springer
192 Bladzijden
Gewicht: 0,299 kg
Taal: eng/Englisch
Boek bevindt zich in het datenbestand sinds 2010-04-27T20:14:00+02:00 (Amsterdam)
Boek voor het laatst gevonden op 2025-10-21T21:51:16+02:00 (Amsterdam)
ISBN/EAN: 9789048178766
ISBN - alternatieve schrijfwijzen:
90-481-7876-2, 978-90-481-7876-6
alternatieve schrijfwijzen en verwante zoekwoorden:
Auteur van het boek: gössel, marienfeld, gossel, michael goss, goessel, gosse, michael marie, marien, gößel
Titel van het boek: electronic methods
Gegevens van de uitgever
Auteur: Michael Gössel; Vitaly Ocheretny; Egor Sogomonyan; Daniel Marienfeld
Titel: Frontiers in Electronic Testing; New Methods of Concurrent Checking
Uitgeverij: Springer; Springer Netherland
182 Bladzijden
Verschijningsjaar: 2010-10-28
Dordrecht; NL
Gedrukt / Gemaakt in
Taal: Engels
106,99 € (DE)
109,99 € (AT)
118,00 CHF (CH)
POD
VIII, 182 p.
BC; Hardcover, Softcover / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Elektrotechnik; Verstehen; CMOS; Computer; Concurrent Checking; Reliability for Nanotechnologies; Self-Checking Adders; Self-Checking Circuits; Soft Error Detection and Correction; computer science; Electrical and Electronic Engineering; Electronic Circuits and Systems; Computer Modelling; Schaltkreise und Komponenten (Bauteile); Computermodellierung und -simulation; BB
Physical Faults and Functional Errors.- Principles of Concurrent Checking.- Concurrent Checking for the Adders.Of great importance for the emerging nanotechnologies with their increasing numbers of transient faults Shows in a systematic way how the best possible state-of-the-art digital error detection circuits can be designed The only book which describes the most important methods of concurrent checking developed in the last 15 years The only book which contains a detailed description of the best possible error detection circuits for all types of adders Shows for the first time how soft-error correction can be combined with concurrent checking
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