ISBN: 9789048178766

Book Details Title: New Methods of Concurrent Checking   Item Condition: New… Meer...

Book Details Title: New Methods of Concurrent Checking   Item Condition: New Author: Gossel, Michael   ISBN 10: 9048178762 Publisher: Springer   ISBN 13: 9789048178766 Published On: 2010-10   SKU: 4444-LSI-9789048178766 Binding: PF   Language: ENG Edition:   List Price: - At AwesomeBooks we believe that good quality and speed of service is what pleases our customers and according to this we have a product guarantee on all our books.All used books sold by AwesomeBooks: Will be clean, not soiled or stained. All pages will be present and undamaged. Books will be free of page markings. Some pages may be slightly dog-eared through previous use. The spine may show some creasing through previous use. Ultimately we would never send any book we would not pick up and read ourselves. All new books sold by AwesomeBooks: Will be completely new, sourced from the publisher. Wrapped carefully to prevent damage or curling of book edges. 100% money back guaranteeIf you are not satisfied for any reason, simply drop us an email and we will give you a 100% refund upon returning the item. If you are not happy then neither are we. Shipping Details Destination Average Shipping Speed(delivered to your door) Postage and Packaging USA 5-14 Days Free Worldwide 7-21 Days $0.99 If your order has not be reached you within a maximum of 21 days please contact us and we will respond immediately to help.  Return Policy At AwesomeBooks, we believe our customers should feel free to order any of our products in the knowledge that they can return anything back within 30 days of purchasing an item for any reason.We will not make it awkward, if you want to return something then all you have to do is ask! Simply drop us an email to the address given on your order confirmation email or login to your paypal account used for payment and send us an email from there. For defects or problems caused before receipt of an item we will of course provide full instructions on how to return the item to us. For other issues (perhaps you did not like a product or it did not live up to expectations), we are happy to refund all costs but require the buyer to pay the return postage cost.Once you drop us an email requesting a return, we will let you know the precise return method quickly and conveniently. , Nieuw, Festpreisangebot, [LT: FixedPrice], PublishedOn: 2010-10, EAN: 9789048178766, Series: Frontiers in Electronic Testing Ser. Publication Year: 2010, Type: Textbook, Format: Trade Paperback, Language: English, Publication Name: New Methods of Concurrent Checking, Item Length: 9.3in. Item Width: 6.1in. Item Weight: 10.7 Oz, Number of Pages: VIII, 182 Pages, Springer Netherlands<

2010, ISBN: 9048178762

[EAN: 9789048178766], Neubuch, [SC: 0.0], [PU: Springer Netherlands], CMOS; COMPUTER; CONCURRENTCHECKING; RELIABILITYFORNANOTECHNOLOGIES; SELF-CHECKINGADDERS; SELF-CHECKINGCIRCUITS; SOFTE… Meer...

[EAN: 9789048178766], Neubuch, [SC: 0.0], [PU: Springer Netherlands], CMOS; COMPUTER; CONCURRENTCHECKING; RELIABILITYFORNANOTECHNOLOGIES; SELF-CHECKINGADDERS; SELF-CHECKINGCIRCUITS; SOFTERRORDETECTIONANDCORRECTION; COMPUTERSCIENCE, Druck auf Anfrage Neuware -Computers are everywhere around us. We, for example, as air passengers, car drivers, laptop users with Internet connection, cell phone owners, hospital patients, inhabitants in the vicinity of a nuclear power station, students in a digital library or customers in a supermarket are dependent on their correct operation. Computers are incredibly fast, inexpensive and equipped with almost unimag- able large storage capacity. Up to 100 million transistors per chip are quite common today - a single transistor for each citizen of a large capital city in the world can be 2 easily accommodated on an ordinary chip. The size of such a chip is less than 1 cm . This is a fantastic achievement for an unbelievably low price. However, the very small and rapidly decreasing dimensions of the transistors and their connections over the years are also the reason for growing problems with reliability that will dramatically increase for the nano-technologies in the near future. Can we always trust computers Are computers always reliable Are chips suf- ciently tested with respect to all possible permanent faults if we buy them at a low price or have errors due to undetected permanent faults to be discovered by c- current checking Besides permanent faults, many temporary or transient faults are also to be expected. 192 pp. Englisch, Books<

2010, ISBN: 9789048178766

gebonden uitgave

[ED: Taschenbuch], [PU: Springer Netherland], Computers are everywhere around us. We, for example, as air passengers, car drivers, laptop users with Internet connection, cell phone owners… Meer...

[ED: Taschenbuch], [PU: Springer Netherland], Computers are everywhere around us. We, for example, as air passengers, car drivers, laptop users with Internet connection, cell phone owners, hospital patients, inhabitants in the vicinity of a nuclear power station, students in a digital library or customers in a supermarket are dependent on their correct operation. Computers are incredibly fast, inexpensive and equipped with almost unimag- able large storage capacity. Up to 100 million transistors per chip are quite common today - a single transistor for each citizen of a large capital city in the world can be 2 easily accommodated on an ordinary chip. The size of such a chip is less than 1 cm . This is a fantastic achievement for an unbelievably low price. However, the very small and rapidly decreasing dimensions of the transistors and their connections over the years are also the reason for growing problems with reliability that will dramatically increase for the nano-technologies in the near future. Can we always trust..., DE, [SC: 0.00], Neuware, gewerbliches Angebot, 192, [GW: 300g], Softcover reprint of hardcover 1st ed. 2008, Banküberweisung, PayPal, [CT: Sonstiges / Sonstiges]<

2010, ISBN: 9048178762

gebonden uitgave

Softcover reprint of hardcover 1st ed. 2008 Kartoniert / Broschiert Elektrotechnik, Computermodellierung und -simulation, CMOS; computer; ConcurrentChecking; ReliabilityforNanotechnolog… Meer...

Softcover reprint of hardcover 1st ed. 2008 Kartoniert / Broschiert Elektrotechnik, Computermodellierung und -simulation, CMOS; computer; ConcurrentChecking; ReliabilityforNanotechnologies; Self-CheckingAdders; Self-CheckingCircuits; SoftErrorDetectionandCorrection; computerscience, met couverture 11, [PU:Springer Netherlands; Springer Netherland]<

2010, ISBN: 9789048178766

auteur: Gössel, Michael, auteur: Ocheretny, Vitaly, auteur: Sogomonyan, Egor, auteur: Marienfeld, Daniel, Springer, Paperback, Auflage: Softcover reprint of hardcover 1st ed. 2008, 190 Se… Meer...

auteur: Gössel, Michael, auteur: Ocheretny, Vitaly, auteur: Sogomonyan, Egor, auteur: Marienfeld, Daniel, Springer, Paperback, Auflage: Softcover reprint of hardcover 1st ed. 2008, 190 Seiten, Publiziert: 2010-10-28T00:00:01Z, Produktgruppe: Book, 1 kg, Computertechnologie, Computers & internet, Categorieën, Boeken, Elektrisch & elektronisch, Techniek & transport, Energieproductie & -winning, Engelstalige boeken, Specialty Stores, Springer, 2010<