2010, ISBN: 9789048181124

Kartoniert, 224 Seiten, 235mm x 155mm x 13mm, Sprache(n): eng Coverage of novel techniques to automate IC debugging, a subject rarely covered in other books Comprehensive scope and solu… Meer...

Kartoniert, 224 Seiten, 235mm x 155mm x 13mm, Sprache(n): eng Coverage of novel techniques to automate IC debugging, a subject rarely covered in other books Comprehensive scope and solutions: from RTL to post-silicon debugging The innovative techniques covered in this book are recent and have been featured by MIT Technology Review, EE Times, SCD Source, IEEE Computer, and other sources First empirical comparison of several methods for spare-cell insertion A variety of examples and figures to illustrate key concepts and algorithmsFunctional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices.Winner of the EDAA (European Design Automation Association) Outstanding Monograph Award in the Verification section. Co-authors Bertacco and Markov are existing Springer authors Versandkostenfreie Lieferung Automaticdebugging, Errordiagnosis, Errorrepair, Post-silicondebugging, algorithms, circuitdesign, formalverification, integratedcircuit, Layout, Simulation, verification<

ISBN: 9789048181124

Functional Design Errors in Digital Circuits Diagnosiscovers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Lev… Meer...

Functional Design Errors in Digital Circuits Diagnosiscovers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices. | Functional Design Errors in Digital Circuits by Kai-hui Chang Paperback | Indigo Chapters Books > Science & Nature > Science > Technology > Superconductors P10117, Kai-hui Chang<

2010, ISBN: 9789048181124

pocketboek

[ED: Kartoniert / Broschiert], [PU: Springer Netherlands], Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Coverage of novel techniques to… Meer...

[ED: Kartoniert / Broschiert], [PU: Springer Netherlands], Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Coverage of novel techniques to automate IC debugging, a subject rarely covered in other booksComprehensive scope and solutions: from RTL to post-silicon debugg, DE, [SC: 0.00], Neuware, gewerbliches Angebot, Taschenbuch, 200, [GW: 322g], 1. Auflage, Banküberweisung, PayPal, [CT: Naturwissenschaft/Mathematik / Sonstiges - Naturwissenschaften]<

2010, ISBN: 9789048181124

Mitwirkende: Markov, Igor L. Mitwirkende: Bertacco, Valeria, Springer, Taschenbuch, Auflage: Softcover reprint of hardcover 1st ed. 2009, 224 Seiten, Publiziert: 2010-10-28T00:00:01Z, Pro… Meer...

Mitwirkende: Markov, Igor L. Mitwirkende: Bertacco, Valeria, Springer, Taschenbuch, Auflage: Softcover reprint of hardcover 1st ed. 2009, 224 Seiten, Publiziert: 2010-10-28T00:00:01Z, Produktgruppe: Buch, 0.72 kg, CAD & CAM, Grafik & Multimedia, Computer & Internet, Kategorien, Bücher, Informatik, IT-Ausbildung & -Berufe, Elektrotechnik, Ingenieurwissenschaft & Technik, Naturwissenschaften & Technik, Verschiedenes, Springer, 2010<

2010, ISBN: 9048181127

gebonden uitgave

Softcover reprint of hardcover 1st ed. 2009 Kartoniert / Broschiert Computer-Aided Design (CAD), Rechnerarchitektur und Logik-Entwurf, Automatic debugging; Error diagnosis; Error repair… Meer...

Softcover reprint of hardcover 1st ed. 2009 Kartoniert / Broschiert Computer-Aided Design (CAD), Rechnerarchitektur und Logik-Entwurf, Automatic debugging; Error diagnosis; Error repair; Post-silicon debugging; algorithms; circuit design; formal verification; integrated circuit; Layout; Simulation; verification, mit Schutzumschlag 11, [PU:Springer Netherlands; Springer Netherland]<