- 5 resultaten
laagste prijs: € 138,10, hoogste prijs: € 176,14, gemiddelde prijs: € 157,01
1
Functional Design Errors in Digital Circuits Diagnosis Correction and Repair - Kai-Hui Chang, Valeria Bertacco, Igor L. Markov
bestellen
bij buchfreund.de
€ 176,14
verzending: € 0,001
bestellenGesponsorde link
Kai-Hui Chang, Valeria Bertacco, Igor L. Markov:

Functional Design Errors in Digital Circuits Diagnosis Correction and Repair - nieuw boek

2010, ISBN: 9789048181124

Kartoniert, 224 Seiten, 235mm x 155mm x 13mm, Sprache(n): eng Coverage of novel techniques to automate IC debugging, a subject rarely covered in other books Comprehensive scope and solu… Meer...

Verzendingskosten:Versandkostenfrei innerhalb der BRD. (EUR 0.00) MARZIES Buch- und Medienhandel, 14621 Schönwalde-Glien
2
Functional Design Errors in Digital Circuits by Kai-hui Chang Paperback | Indigo Chapters
bestellen
bij Indigo.ca
C$ 222,50
(ongeveer € 164,91)
bestellenGesponsorde link
Functional Design Errors in Digital Circuits by Kai-hui Chang Paperback | Indigo Chapters - nieuw boek

ISBN: 9789048181124

Functional Design Errors in Digital Circuits Diagnosiscovers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Lev… Meer...

new in stock. Verzendingskosten:zzgl. Versandkosten., exclusief verzendingskosten
3
Functional Design Errors in Digital Circuits: Diagnosis Correction and Repair (Lecture Notes in Electrical Engineering, Band 32) - Chang, Kai-hui
bestellen
bij Amazon.de (Intern. Bücher)
€ 138,10
verzending: € 3,001
bestellenGesponsorde link
Chang, Kai-hui:
Functional Design Errors in Digital Circuits: Diagnosis Correction and Repair (Lecture Notes in Electrical Engineering, Band 32) - pocketboek

2010

ISBN: 9789048181124

Mitwirkende: Markov, Igor L. Mitwirkende: Bertacco, Valeria, Springer, Taschenbuch, Auflage: Softcover reprint of hardcover 1st ed. 2009, 224 Seiten, Publiziert: 2010-10-28T00:00:01Z, Pro… Meer...

Verzendingskosten:Gewöhnlich versandfertig in 6 bis 7 Tagen. Die angegebenen Versandkosten können von den tatsächlichen Kosten abweichen. (EUR 3.00) preigu
4
Functional Design Errors in Digital Circuits Diagnosis Correction and Repair - Chang, Kai-Hui; Bertacco, Valeria; Markov, Igor L.
bestellen
bij Achtung-Buecher.de
€ 155,91
verzending: € 0,001
bestellenGesponsorde link
Chang, Kai-Hui; Bertacco, Valeria; Markov, Igor L.:
Functional Design Errors in Digital Circuits Diagnosis Correction and Repair - pocketboek

2010, ISBN: 9048181127

gebonden uitgave

Softcover reprint of hardcover 1st ed. 2009 Kartoniert / Broschiert Computer-Aided Design (CAD), Rechnerarchitektur und Logik-Entwurf, Automaticdebugging; Errordiagnosis; Errorrepair; P… Meer...

Verzendingskosten:Versandkostenfrei innerhalb der BRD. (EUR 0.00) MARZIES.de Buch- und Medienhandel, 14621 Schönwalde-Glien
5
Functional Design Errors in Digital Circuits - Valeria Bertacco/ Kai-Hui Chang/ Igor L. Markov
bestellen
bij Hugendubel.de
€ 149,99
verzending: € 0,001
bestellenGesponsorde link
Valeria Bertacco/ Kai-Hui Chang/ Igor L. Markov:
Functional Design Errors in Digital Circuits - pocketboek

2009, ISBN: 9048181127

gebonden uitgave

Functional Design Errors in Digital Circuits ab 149.99 € als Taschenbuch: Diagnosis Correction and Repair. Softcover reprint of hardcover 1st ed. 2009. Aus dem Bereich: Bücher, Taschenbüc… Meer...

Nr. 14051560. Verzendingskosten:, , DE. (EUR 0.00)

1Aangezien sommige platformen geen verzendingsvoorwaarden meedelen en deze kunnen afhangen van het land van levering, de aankoopprijs, het gewicht en de grootte van het artikel, een eventueel lidmaatschap van het platform, een rechtstreekse levering door het platform of via een derde aanbieder (Marktplaats), enz., is het mogelijk dat de door euro-boek.nl meegedeelde verzendingskosten niet overeenstemmen met deze van het aanbiedende platform.

Bibliografische gegevens van het best passende boek

Bijzonderheden over het boek
Functional Design Errors in Digital Circuits: Diagnosis Correction and Repair (Lecture Notes in Electrical Engineering, Band 32)

Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices.

Gedetalleerde informatie over het boek. - Functional Design Errors in Digital Circuits: Diagnosis Correction and Repair (Lecture Notes in Electrical Engineering, Band 32)


EAN (ISBN-13): 9789048181124
ISBN (ISBN-10): 9048181127
Gebonden uitgave
pocket book
Verschijningsjaar: 2010
Uitgever: Springer
224 Bladzijden
Gewicht: 0,345 kg
Taal: eng/Englisch

Boek bevindt zich in het datenbestand sinds 2011-04-08T00:51:00+02:00 (Amsterdam)
Detailpagina laatst gewijzigd op 2023-11-16T22:13:08+01:00 (Amsterdam)
ISBN/EAN: 9789048181124

ISBN - alternatieve schrijfwijzen:
90-481-8112-7, 978-90-481-8112-4
alternatieve schrijfwijzen en verwante zoekwoorden:
Auteur van het boek: markov, chang, hui kai
Titel van het boek: error design, function circuits, electrical engineering, hui kai


Gegevens van de uitgever

Auteur: Kai-hui Chang; Igor L. Markov; Valeria Bertacco
Titel: Lecture Notes in Electrical Engineering; Functional Design Errors in Digital Circuits - Diagnosis Correction and Repair
Uitgeverij: Springer; Springer Netherland
200 Bladzijden
Verschijningsjaar: 2010-10-28
Dordrecht; NL
Gedrukt / Gemaakt in
Gewicht: 0,454 kg
Taal: Engels
160,49 € (DE)
164,99 € (AT)
177,00 CHF (CH)
POD
XXIV, 200 p.

BC; Circuits and Systems; Hardcover, Softcover / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Schaltkreise und Komponenten (Bauteile); Verstehen; Automatic debugging; Error diagnosis; Error repair; Post-silicon debugging; algorithms; circuit design; formal verification; integrated circuit; layout; simulation; verification; Computer-Aided Engineering (CAD, CAE) and Design; Logic Design; Electronic Circuits and Systems; Computer-Aided Engineering (CAD, CAE) and Design; Logic Design; Computer-Aided Design (CAD); Rechnerarchitektur und Logik-Entwurf; BB

Dedication. List of Figures. List of Tables. Preface. Part I Background and Prior Art. 1. INTRODUCTION. 1.1 Design Trends and Challenges. 1.2 State of the Art. 1.3 Our Approach. 1.4 Key Innovations and Book Outline. 2. CURRENT LANDSCAPE IN DESIGN AND VERIFICATION. 2.1 Front-End Design. 2.2 Back-End Logic Design. 2.3 Back-End Physical Design. 2.4 Post-Silicon Debugging. 3. FINDING BUGS AND REPAIRING CIRCUITS. 3.1 Simulation-Based Verification. 3.2 Formal Verification. 3.3 Design for Debugging and Post-Silicon Metal Fix. Part II FogClearMethodologies and Theoretical Advances in Error Repair. 4. CIRCUIT DESIGN AND VERIFICATION METHODOLOGIES. 4.1 Front-End Design. 4.2 Back-End Logic Design. 4.3 Back-End Physical Design. 4.4 Post-Silicon Debugging. 5. COUNTEREXAMPLE-GUIDED ERROR-REPAIR FRAMEWORK. 5.1 Background. 5.2 Error-Correction Framework for Combinational Circuits. 6. SIGNATURE-BASED RESYNTHESIS TECHNIQUES. 6.1 Pairs of Bits to be Distinguished (PBDs). 6.2 Resynthesis Using Distinguishing-Power Search. 6.3 Resynthesis Using Goal-Directed Search. 7. SYMMETRY-BASED REWIRING. 7.1 Background. 7.2 Exhaustive Search for Functional Symmetries. 7.3 Post-Placement Rewiring. 7.4 Experimental Results. 7.5 Summary. Part III FogClear Components. 8. BUG TRACE MINIMIZATION. 8.1 Background and PreviousWork. 8.2 Analysis of Bug Traces. 8.3 Proposed Techniques. 8.4 Implementation Insights. 8.5 Experimental Results. 8.6 Summary. 9. FUNCTIONAL ERROR DIAGNOSIS AND CORRECTION. 9.1 Gate-Level Error Repair for Sequential Circuits. 9.2 Register-Transfer-Level Error Repair. 9.3 Experimental Results. 9.4 Summary. 10. INCREMENTAL VERIFICATION FOR PHYSICAL SYNTHESIS. 10.1 Background. 10.2 Incremental Verification. 10.3 Experimental Results. 10.4 Summary. 11. POST-SILICON DEBUGGING AND LAYOUT REPAIR. 11.1 Physical Safeness and Logical Soundness. 11.2 New ResynthesisTechnique—SafeResynth. 11.3 Physically-Aware Functional Error Repair. 11.4 Automating Electrical Error Repair. 11.5 Experimental Results. 11.6 Summary. 12. METHODOLOGIES FOR SPARE-CELL INSERTION. 12.1 Existing Spare-Cell Insertion Methods. 12.2 Cell Type Analysis. 12.3 Placement Analysis. 12.4 Our Methodology. 12.5 Experimental Results. 12.6 Summary. 13. CONCLUSIONS. Index. References.

< naar Archief...