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Application of Particle and Laser Beams in Materials Technology - A.N. Tikhonov
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The development of advanced materials with preselected properties is one of the main goals of materials research.Of especial interest are electronics, high-temperature and supemard materi… Meer...

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Application of Particle and Laser Beams in Materials Technology - P. Misaelides
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Application of Particle and Laser Beams in Materials Technology - nieuw boek

ISBN: 9789401584593

The development of advanced materials with preselected properties is one of the main goals of materials research. Of especial interest are electronics, high-temperature and supemard mater… Meer...

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Application of Particle and Laser Beams in Materials Technology - nieuw boek

ISBN: 9789401584593

Proceedings of the NATO Advanced Study Institute, Kallithea, Chalkidiki, Greece, May 8--21, 1994 ; ; Scientific, Technical and Medical > Mechanical engineering & materials > Materials sc… Meer...

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Application of Particle and Laser Beams in Materials Technology - nieuw boek

2013, ISBN: 9789401584593

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Application of Particle and Laser Beams in Materials Technology - nieuw boek

2013, ISBN: 9789401584593

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Application of Particle and Laser Beams in Materials Technology
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9789401584593

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EAN (ISBN-13): 9789401584593
Verschijningsjaar: 2013
Uitgever: Springer Netherlands

Boek bevindt zich in het datenbestand sinds 2017-01-08T22:38:15+01:00 (Amsterdam)
Detailpagina laatst gewijzigd op 2023-07-17T13:10:21+02:00 (Amsterdam)
ISBN/EAN: 9789401584593

ISBN - alternatieve schrijfwijzen:
978-94-015-8459-3
alternatieve schrijfwijzen en verwante zoekwoorden:
Titel van het boek: materials technology, beams

Gegevens van de uitgever

Auteur: P. Misaelides
Titel: NATO Science Series E; Application of Particle and Laser Beams in Materials Technology - Applied Sciences (Continued Within NATO Science Series II: Mathematics, Physics and Chemistry)
Uitgeverij: Springer; Springer Netherland
678 Bladzijden
Verschijningsjaar: 2013-03-09
Dordrecht; NL
Taal: Engels
309,23 € (DE)
317,90 € (AT)
354,00 CHF (CH)
Available
XIII, 678 p.

EA; E107; eBook; Nonbooks, PBS / Technik/Maschinenbau, Fertigungstechnik; Werkstoffprüfung; Verstehen; Vakuuminjektionsverfahren; advanced materials; alloy; laser; surface; surface analysis; B; Characterization and Analytical Technique; Surfaces, Interfaces and Thin Film; Condensed Matter Physics; Nuclear Physics; Chemistry and Materials Science; Materialwissenschaft; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); Atom- und Molekularphysik; BC

I. Fundamentals.- Fundamental Aspects of Ion Electron Interactions.- Fundamentals of Ion-Solid Interactions: Atomic Collisions.- Excitation and Ionization In Fast Ion-Atom Collisions Due To Projectile-Electron — Target-Electron Interactions.- Radiation Induced Point Defects and Diffusion.- High Temperature Oxidation and Corrosion of Metals and Alloys: Fundamentals and Influence of High Energy Beams.- Thin Films of High-Temperature Superconductors: Application-Oriented Studies of Growth and Properties.- II. Surface Analysis Techniques.- An Overview of Surface Analysis. Application to the Adsorption of Li on Single Crystals of Layered Compounds.- Depth Profiling in Combination with Sputtering.- A SIMS Study of the Inter-Diffusion of Group III Atoms in a Distributed Bragg Reflector.- Thermal He-Atom Scattering for the Study of Surface Systems: K on Si(001).- Experimental and Monte-Carlo Simulation Studies of the Surface Concentration Changes in ZrO2 under Ion Bombardment.- Ion-Induced Photon Emission of Materials and Possibilities of its Application for Surface Diagnostics.- III. Laser Beams in Materials Technology.- The Raman Approach to Materials Science.- Laser-Material Interaction. Plasma Formation and Applications.- Optical Spectrometry Coupled with Laser Ablation for Analytical Applications on Solids.- In Situ Laser Beam Probes for Semiconductor Processing.- Laser Deposition and Patterning of Diamond Films.- Laser-Raman Spectroscopy of Some Lanthanide/Hgl2 Heterometallic Complexes (HL=5,7-Dimethyl-1,8-Naphthyridine-2-OL).- IV. Accelerator-Based Techniques in Materials Technology.- Accelerators in Materials Research.- Application of Elastic Recoil Detection in Materials Analysis.- Applications of High Energy Ion Scattering in Materials Science.- High Energy HeavyIon RBS, ERDA and Channelling.- Some New Detection Techniques for Light-Ion Scattering Analysis.- Prompt Gamma-Ray Resonant Nuclear Reaction Analysis for Light Elements: H, Li, F and Na.- Quantitative Determination of Light Elements in Semiconductor Matrices by Charged Particle Activation Analysis.- Thin Layer Activation in Materials Technology.- Optimum Industrial Application of the Thin Layer Activation Technique.- Ion Beam Analysis of Glasses — Industrial Applications.- Nuclear Reaction Analysis of Corroded Glass Surfaces.- Ion-Beam Archaeometry: Technological Assessment of Ancient and Medieval Materials.- Non-Destructive Analysis Of American Gold Jewellery Items By PIXE, RBS and PIGE.- Recoil Spectrometry: A Suitable Method for Studying Interfacial Reactions in Metal-InP Systems.- Bismuth-Implanted Silicon Reference Material Revisited: The Concept of Traceability and the Individual Characterisation of Chips.- Energy Dispersive X-Ray Analysis of the Tin Distribution on Electrolytically Coloured Anodised Aluminium.- Determination of Sulphur and Copper Distribution on Chemically Modified HEU-Type Zeolite Crystals by Means of Nuclear Resonant Reaction Analysis Techniques, Scanning Electron Microscopy and X-Ray Fluorescence.- Modern Technological Projects with High Power Electron Beams.- Computer-Aided Design of Technological Electron-Optical Systems.- Ion Beam Mixing.- Materials Modification Using Electron Beams.- Deposition and Etching Mechanisms in Plasma Thin Film Processes.- Active Modification and Amorphisation of Materials by Low-Energy Ion Irradiation.- SIMOX Thin Films. Structural and Electrical Characterisation using FTIR Spectroscopy.- The Key Role of Electron Beams in IC Technology.- Cadmium Sulphide Microcrystallite-Doped Silicon Dioxide Thin FilmsPrepared by RF-Sputtering: Growth and Physical Characterisation.- VI. Synchrotron Radiation.- Synchrotron Radiation Sources for Materials Technology.- Photoemission and EXAFS Study of Na on 2H-TaS2.- Characterisation of Nearly Stoichiometric Buried SixNy Films with EXAFS and NEXAFS.- List of Contributors.- List of Participants.

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Laatste soortgelijke boek:
9789048145102 Application of Particle and Laser Beams in Materials Technology: 283 (Misaelides, P.)

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