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ISBN-13: 9781402030727, 978-1402030727. This book is a tribute to Professor John P Keeves for the advocacy of the Rasch model in Australia. Format: Hardback. Papers in Honour of John P. K… Meer...
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Applied Rasch Measurement: A Book of Exemplars - gebonden uitgave, pocketboek
2005, ISBN: 9781402030727
While the primary purpose of the book is a celebration of John’s contributions to the field of measurement, a second and related purpose is to provide a useful resource. We beli… Meer...
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ISBN: 9781402030727
While the primary purpose of the book is a celebration of John’s contributions to the field of measurement, a second and related purpose is to provide a useful resource. We believe that t… Meer...
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2005, ISBN: 140203072X
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Applied Rasch Measurement: A Book of Exemplars - gebonden uitgave, pocketboek
2005, ISBN: 9781402030727
Papers in Honour of John P. Keeves, Buch, Hardcover, 2005 ed. [PU: Springer-Verlag New York Inc.], Springer-Verlag New York Inc., 2005
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Angewandte Rasch-Messung: Ein Exemplarbuch - 9781402030727 - gebonden uitgave, pocketboek
ISBN: 9781402030727
ISBN-13: 9781402030727, 978-1402030727. This book is a tribute to Professor John P Keeves for the advocacy of the Rasch model in Australia. Format: Hardback. Papers in Honour of John P. K… Meer...
S. Alagumalai#D. D. Curtis#N. Hungi:
Applied Rasch Measurement: A Book of Exemplars - gebonden uitgave, pocketboek2005, ISBN: 9781402030727
While the primary purpose of the book is a celebration of John’s contributions to the field of measurement, a second and related purpose is to provide a useful resource. We beli… Meer...
bij Orellfuessli.ch
ISBN: 9781402030727
While the primary purpose of the book is a celebration of John’s contributions to the field of measurement, a second and related purpose is to provide a useful resource. We believe that t… Meer...
2005, ISBN: 140203072X
Applied Rasch Measurement: A Book of Exemplars ab 72.67 € als gebundene Ausgabe: Papers in Honour of John P. Keeves. Auflage 2005. Aus dem Bereich: Bücher, Schule & Lernen, Medien > Büche… Meer...
Applied Rasch Measurement: A Book of Exemplars - gebonden uitgave, pocketboek
2005, ISBN: 9781402030727
Papers in Honour of John P. Keeves, Buch, Hardcover, 2005 ed. [PU: Springer-Verlag New York Inc.], Springer-Verlag New York Inc., 2005
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Gedetalleerde informatie over het boek. - Applied Rasch Measurement: A Book of Exemplars
EAN (ISBN-13): 9781402030727
ISBN (ISBN-10): 140203072X
Gebonden uitgave
Verschijningsjaar: 2005
Uitgever: Springer-Verlag New York Inc.
359 Bladzijden
Gewicht: 0,728 kg
Taal: eng/Englisch
Boek bevindt zich in het datenbestand sinds 2007-05-20T10:51:18+02:00 (Amsterdam)
Detailpagina laatst gewijzigd op 2023-07-17T20:33:38+02:00 (Amsterdam)
ISBN/EAN: 140203072X
ISBN - alternatieve schrijfwijzen:
1-4020-3072-X, 978-1-4020-3072-7
alternatieve schrijfwijzen en verwante zoekwoorden:
Auteur van het boek: david curtis, rasch, ramuz, sivak
Titel van het boek: papers honour, asia book, exempla, aline, rasch buch, measurement
Gegevens van de uitgever
Auteur: Sivakumar Alagumalai; David D. Curtis; Njora Hungi
Titel: Education in the Asia-Pacific Region: Issues, Concerns and Prospects; Applied Rasch Measurement: A Book of Exemplars - Papers in Honour of John P. Keeves
Uitgeverij: Springer; Springer Netherland
360 Bladzijden
Verschijningsjaar: 2005-02-15
Dordrecht; NL
Taal: Engels
213,99 € (DE)
219,99 € (AT)
236,00 CHF (CH)
Available
XVIII, 360 p.
BB; Hardcover, Softcover / Pädagogik; Pädagogik; Verstehen; Interpretation; mathematics; research; test theory; Education; International and Comparative Education; Probability Theory; Bildungssysteme und -strukturen; Wahrscheinlichkeitsrechnung und Statistik; Stochastik; EA; BC
Measurement and the Rasch model.- Classical Test Theory.- Objective Measurement.- The Rasch Model Explained.- Applications of the Rasch Model — Tests and Competencies.- Monitoring Mathematics Achievement over Time.- Manual and Automatic Estimates of Growth and Gain Across Year Levels: How Close is Close?.- Japanese Language Learning and the Rasch Model.- Chinese Language Learning and the Rasch Model.- Employing the Rasch Model to Detect Biased Items.- Raters and Examinations.- Comparing Classical and Contemporary Analyses and Rasch Measurement.- Combining Rasch Scaling and Multi-Level Analysis.- Applications of the Rasch Model — Attitudes Scales and Views.- Rasch and Attitude Scales: Explanatory Style.- Science Teachers’ Views on Science, Technology and Society Issues.- Estimating the Complexity of Workplace Rehabilitation Tasks Using Rasch Analysis.- Creating a Scale as a General Measure of Satisfaction for Information and Communication Technology Users.- Extensions of the Rasch model.- Multidimensional Item Responses: Multimethod-Multitrait Perspectives.- Information Functions for the General Dichotomous Unfolding Model.- Past, Present and Future: An Idiosyncratic View of Rasch Measurement.- Epilogue.- Our Experiences and Conclusion.Andere boeken die eventueel grote overeenkomsten met dit boek kunnen hebben:
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9789048101757 Applied Rasch Measurement: A Book of Exemplars
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