Surface X-Ray and Neutron Scattering Proceedings of the 2nd International Conference, Physik Zentrum, Bad Honnef, Fed. Rep. of Germany, June 25¿28, 1991 - pocketboek

EAN (ISBN-13): 9783642771460
ISBN (ISBN-10): 3642771467
pocket book
Verschijningsjaar: 2011
Uitgever: Springer Berlin Heidelberg

Boek bevindt zich in het datenbestand sinds 2013-12-17T09:30:00+01:00 (Amsterdam)
Detailpagina laatst gewijzigd op 2023-07-30T18:16:03+02:00 (Amsterdam)
ISBN/EAN: 3642771467

ISBN - alternatieve schrijfwijzen:
3-642-77146-7, 978-3-642-77146-0
alternatieve schrijfwijzen en verwante zoekwoorden:
Auteur van het boek: robinson, ian, hartmut zabel, hart rob
Titel van het boek: scat, ray, surface may june, physik band, bad honnef, neutron scattering

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Gegevens van de uitgever

Auteur: Hartmut Zabel; Ian K. Robinson
Titel: Springer Proceedings in Physics; Surface X-Ray and Neutron Scattering - Proceedings of the 2nd International Conference, Physik Zentrum, Bad Honnef, Fed. Rep. of Germany, June 25–28, 1991
Uitgeverij: Springer; Springer Berlin
256 Bladzijden
Verschijningsjaar: 2011-11-22
Berlin; Heidelberg; DE
Gedrukt / Gemaakt in
Taal: Engels
106,99 € (DE)
109,99 € (AT)
118,00 CHF (CH)
POD
XI, 256 p.

BC; Hardcover, Softcover / Technik/Maschinenbau, Fertigungstechnik; Werkstoffprüfung; Verstehen; Liquid surfaces; Neutron scattering; Phase transitions; Surface crystallography; diffraction; scattering; surface; thin films; x-ray diffraction; Crystallography and Scattering Methods; Surfaces, Interfaces and Thin Film; Physical Chemistry; Technology and Engineering; Materialwissenschaft; Physikalische Chemie; Ingenieurswesen, Maschinenbau allgemein; BB

Conference Summary.- I Surface Crystallography and Phase Transitions.- Surface X-Ray Crystallography and STM Images.- Determination of Metal Adsorbed Surfaces by X-Ray Diffraction.- Au Adsorption on Si(111) Studied by Grazing Incidence X-Ray Diffraction.- Grazing Incidence X-Ray Scattering Study of Staircases of Steps on Si(001) Surfaces.- Structure and Phase Transitions of Ge(111) and Si(111) Surfaces at High Temperatures.- Anomalous Scattering Applied to Co/Si(111) Interface Structure.- X-Ray Reflectivity Studies of Au Surfaces.- Crystal Truncation Rod as a Convolution of Three-Dimensional Bravais Lattice with X-Ray Reflectivity.- Extended X-Ray Reflectivity Analysis of Si(111)7×7.- Critical Phenomena at Surfaces and Interfaces.- Surface-Induced Order Observed on a Cu3Au(001) Surface.- Thermal Dynamics of (110) fcc Metal Surfaces.- Facet Coexistence in the Roughening Transition of Ag(110).- Kinetics of Ordering with Random Impurities: Pb on Ni(001).- II Reflectivity.- Anomalous Reflectivity: A New Method for Determining Density Profiles of Thin Films.- Specular and Diffuse Scattering Studies of Multilayer Interfaces.- Scattering Cross-Section of X-Rays and Neutrons for Grazing Incidence onto Thin Films.- Total Neutron Reflection: Experiments and Analysis.- Profile Refinement in Neutron Reflectivity and Grazing Angle Diffraction.- III Surface X-Ray Standing Waves.- X-Ray Standing Wave Studies of the Liquid/Solid Interface and Ultrathin Organic Films.- Glancing-Incidence X-Ray Analysis of Layered Materials.- Investigation of the Heavy-Atom Distribution in a Langmuir-Blodgett Film by an X-Ray Total External Reflection and Fluorescence Study.- A Structural Investigation of an Ultra-Thin Langmuir-Blodgett Film by an X-Ray Standing Wave Excited in a LSM Substrate Under theBragg Diffraction Condition.- IV Liquid Surfaces.- The Structure of Self-Assembled Monolayers.- Behenic Acid as a Structural Model for Fatty Acid Monolayers at the Air/Water Interface: An X-Ray Diffraction Study.- X-Ray Scattering Studies of Organic Monolayers on Electrolytic Solutions: Arachidic Acid on CdCl2.- The Phases of Phosphatidyl Ethanolamine Monolayers.- X-Ray Diffraction Studies of Fatty Acid Monolayers on the Surface of Water.- Protein Recognition Processes at Functionalized Lipid Surfaces: A Neutron Reflectivity Study.- Neutron Reflection from Liquid/Liquid Interfaces.- Polymer Interfaces Analysed on a Nanometer Scale: X-Ray and Neutron Reflectometry.- Neutron Reflection from Polymers Adsorbed at the Solid/Liquid Interface.- V Electrochemistry.- Electrochemical Roughening of Au(110) Single Crystal Electrodes.- VI Thin Films and Multilayers.- Reflectivity Studies of Thin Au Films and Au Bicrystals with Grain Boundaries.- Depth Resolved Diffuse Scattering from Buried CoSi2 Layers in Silicon.- Glancing Angle X-Ray Techniques for the Analysis of Ion Beam Modified Surfaces.- Surface Analysis of Borkron Glass for Neutron Applications.- X-Ray Bragg Reflectivity of ErAs Epitaxial Films.- Measurement of Magnetic Field Penetration Depth in Niobium Polycrystalline Films by the Polarized Neutron Reflection Method.- Neutron Reflectivity Studies on Superconducting, Magnetic and Absorbing Thin Films on the Polarized Neutron Spectrometer at the Pulsed Reactor IBR-2.- Magnetic Properties of Ultrathin Co/Ag Films Investigated by Polarised Neutron Reflection.- Depth Selective Real Structure Analysis of Semiconductor Superlattices Using Grazing Incidence X-Ray Diffraction.- Investigation of Interfaces with Grazing Incidence Neutron Radiation.- Roughness Characterization of the Surface and Interface of MBE-Grown Thin Films.- VII Instrumentation and Methods.- Neutron Diffraction Under Grazing Incidence: Recent Results from the Evanescent Wave Diffractometer.- Analytical Calculation of the Resolution Correction Function for X-Ray Surface Structure Analysis at High Exit Angles.- Neutron Double Crystal Diffractometry — A Precise Method for Surface Investigations.- Index of Contributors.